Ultra low pin count interface for die testing
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United States of America Patent
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Jul 29, 2008
Grant Date -
Sep 20, 2007
app pub date -
Mar 20, 2006
filing date -
Mar 20, 2006
priority date (Note) -
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Abstract
An apparatus, a method and a system to test a device. An input/output (I/O) block communicates with an external tester to receive test data and to send test result using first and second communication modes. A logic block parses the test data. A memory stores microcode from the parsed test data. The microcode contains a test program to test a circuit. A controller executes the test program.
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