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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

• KABUSHIKI KAISHA TOSHIBA

International Classification(s)

• G01R:MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC V....

• [Classification Symbol]

• [Patents Count]

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Kamada, Tetsuo	Kanagawa-ken , JP	2	25
Sasaki, Toru	Kanagawa-ken , JP	216	3776
Shimizu, Hiroshi	Kanagawa-ken , JP	500	5315

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
September 01, 2009	US,7584393,B2   US7584393B2	GRANTED PATENT AS SECOND PUBLICATION
January 11, 2007	US,20070011524,A1   US20070011524A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 7584393

Scan test circuit and method of arranging the same

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