Scanning microscope and method for scanning a specimen
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United States of America Patent
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Jun 22, 2004
Grant Date -
Feb 20, 2003
app pub date -
Aug 14, 2002
filing date -
Aug 14, 2001
priority date (Note) -
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Abstract
A scanning microscope possesses at least one illumination source for emitting an illuminating beam that is conveyed via a beam deflection device and an optical system to a specimen and scans the latter, the beam deflection device defining at least one illuminating beam rotation point. A device for axial displacement in particular of the beam deflection device, or of a lens preceding the objective, is provided for imaging of an image of the illuminating beam rotation point into the pupil of the objective.
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