Method for testing a memory device
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United States of America Patent
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Mar 4, 2008
Grant Date -
Dec 23, 2004
app pub date -
Jun 18, 2004
filing date -
Jun 20, 2003
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Disclosed is a method for testing a memory device with a long-term clock signal by automatically performing precharge only after activation. In this method, a signal for precharging the banks of the memory device is automatically generated only at the falling edge of an external signal when a signal for activating the banks is applied. Accordingly, the present invention ensures a stable test of the memory device, reducing the testing time.
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