Built-in self-test using embedded memory and processor in an application specific integrated circuit
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United States of America Patent
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Oct 25, 2011
Grant Date -
Jun 9, 2011
app pub date -
Feb 15, 2011
filing date -
Jul 30, 2001
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Abstract
A test method for an ASIC uses an embedded processor in the ASIC to execute test routines from an embedded memory or an external memory. During ASIC production, the test routines can comprehensively test of the blocks of the ASIC without a complicated test pattern from test equipment. The test routines can also perform power-up tests in systems or end products containing the ASIC. Test selection, activation, and result output can be implement using a few terminals of the ASIC.
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