Hierarchical power supply noise monitoring device and system for very large scale integrated circuits
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United States of America Patent
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Nov 23, 2004
Grant Date -
Jul 1, 2004
app pub date -
Dec 31, 2002
filing date -
Dec 31, 2002
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Abstract
A hierarchical power supply noise monitoring device and system for very large scale integrated circuits. The noise-monitoring device is fabricated on-chip to measure the noise on the chip. The noise-monitoring system includes a plurality of on-chip noise-monitoring devices distributed strategically across the chip. A noise-analysis algorithm analyzes the noise characteristics from the noise data collected from the noise-monitoring devices, and a hierarchical noise-monitoring system maps the noise of each core to the system on chip.
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