Memory device and memory system including test control signal generating circuit
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United States of America Patent
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Jul 19, 2022
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N/A
app pub date -
Oct 21, 2020
filing date -
Mar 20, 2020
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Abstract
A memory system includes a plurality of memory devices coupled to each other through a channel and each including a test clock input pad suitable for receiving an external test clock, a clock generation circuit suitable for generating an input clock and an output clock based on a reference clock and the external test clock in response to a reset signal, a test data processing circuit suitable for parallelizing test data so as to produce parallelized test data and transfer the parallelized test data to a memory area in response to the input clock and the output clock, and a test control signal generation circuit suitable for generating internal test data by serializing the parallelized test data and transferring the internal test data to the channel in response to the input clock and the output clock.
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