Multi-point measuring method and surveying device

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7726033
APP PUB NO 20090241358A1
SERIAL NO

12309060

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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There are provided a telescope unit (5) having a first image pickup unit for acquiring a wide-angle image and a second image pickup unit for acquiring a telescopic image with higher magnification than the wide-angle image, a distance measuring unit for performing distance measurement by projecting a distance measuring light and by receiving a light reflected from an object to be measured, an angle measuring unit for detecting a horizontal angle and a vertical angle of the telescope unit, a drive unit for rotating and driving the telescope unit in a horizontal direction and in a vertical direction, and a control device for controlling image pickup of the first image pickup unit and the second image pickup unit and for controlling the drive unit based on the results of detection from the angle measuring unit, wherein the control device synthesizes a panoramic image by connecting the wide-angle image obtained by the first image pickup unit, sets up a scheduled measuring point by edge processing of the wide-angle image, and extracts the measuring point corresponding to the scheduled measuring points in the telescopic image by scanning the scheduled measuring point and acquiring the telescopic image by the second image pickup unit with respect to scheduled measuring points, and distance measurement is performed on the measuring point.

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Patent Owner(s)

  • KABUSHIKI KAISHA TOPCON

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Anai, Tetsuji Itabashi-ku, JP 43 795
Kaneko, Junki Itabashi-ku, JP 9 251
Nagashima, Terukazu Itabashi-ku, JP 5 92
Ohtomo, Fumio Itabashi-ku, JP 270 5296
Otani, Hitoshi Itabashi-ku, JP 84 2722

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