Method of manufacturing semiconductor device and apparatus for manufacturing semiconductor device

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United States of America Patent

PATENT NO 9190262
APP PUB NO 20140014142A1
SERIAL NO

14024676

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Abstract

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A method of manufacturing a semiconductor device in which an insulating film is filled between patterns etched into a workpiece structure is disclosed. The method includes cleaning etch residues residing between the etched patterns by a first chemical liquid; rinsing the workpiece structure cleaned by the first chemical liquid by a rinse liquid; and coating the workpiece structure rinsed by the rinse liquid with a coating liquid for formation of the insulating film. The cleaning to the coating are carried out within the same processing chamber such that a liquid constantly exists between the patterns of the workpiece structure.

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Patent Owner(s)

  • TOSHIBA MEMORY CORPORATION

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hizawa, Takeshi Mie, JP 9 58
Kiyotoshi, Masahiro Mie, JP 99 3657
Ogawa, Yoshihiro Mie, JP 208 2295
Yamada, Nobuhide Mie, JP 26 119

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