Method for fabricating a memory cell
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United States of America Patent
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-
Jul 31, 2001
Grant Date -
N/A
app pub date -
Sep 21, 1999
filing date -
Sep 21, 1998
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A method for fabricating a memory cell includes forming a first access line (16) for a storage node (140, 210) and forming a second access line (82) operable to access the storage node (140, 210) in connection with the first access line (16). The first access line (16) includes a first terminal (32) and a second terminal (34). The second access line (82) includes a conductive layer (70) connected to the first terminal (32) of the first access line (16). An opening (88) is formed in the second access line (82) for connection of the storage node (140, 210) to the second terminal (34) of the first access line (16). A sidewall (92) is formed in the opening (88) to form a contact hole (94) insulated from the conductor (70) of the second access line (82). The storage node (140, 210) is formed having a self-aligned contact (102) formed in the contact hole (94) and connected to the second terminal (34) of the first access line (16).
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