Method and apparatus for forming a film on an object to be processed

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6454909
SERIAL NO

09611665

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A processing apparatus includes a processing chamber, a support mechanism provided in the processing chamber to support a wafer having an underlying film formed on a major surface and adjacent side face, and a supply member provided at the processing chamber and spaced from the support mechanism, to supply an incoming gas into the processing chamber. A gas carrying mechanism is provided for selectively sending a film forming gas and etching gas to the gas supply member. A main film is formed on a portion of an underlying film formed on the wafer supported on the support mechanism, by using the film forming gas supplied from the gas supply member. A portion of the underlying film, which is exposed, not covered with the main film, is etched away by the etching gas supplied from the gas supplied member.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

  • TOKYO ELECTRON LIMITED

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Matsuse, Kimihiro Inagi, JP 19 1591
Nakatsuka, Sakae Kitakoma-gun, JP 8 348
Oshimo, Kentaro Nakakoma-gun, JP 20 444

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation