Polymeric component bonding
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United States of America Patent
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Apr 5, 2011
Grant Date -
Jun 23, 2005
app pub date -
Apr 14, 2004
filing date -
Mar 23, 1998
priority date (Note) -
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status (Latency Note)
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Abstract
A system is provided for positioning separate portions of a sample in elongate, parallel channels of a sample chamber and for irradiating a sample in the chamber to create a diffraction pattern where the sample and chamber differ in refractive index. The system also can measure absorption of electromagnetic radiation by a sample in the chamber, and can measure the absorption simultaneously with measurement of diffraction by the sample.
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