Pay-per-use access to multiple electronic test capabilities
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United States of America Patent
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-
May 2, 1995
Grant Date -
N/A
app pub date -
Oct 7, 1993
filing date -
Oct 7, 1993
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A system and method for testing an electronic circuit is disclosed. The system includes a circuit board test platform having multiple electronic test capabilities, and a pay-per-use module that is coupled to the circuit board test platform. The pay-per-use module is adapted for monitoring use of the multiple electronic test capabilities of the circuit board test platform, and for debiting a number of usage credits from a usage credit pool based on the use of the multiple electronic test capabilities.
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