Dynamically reconfigurable precision signal delay test system for automatic test equipment
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United States of America Patent
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Mar 14, 2006
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app pub date -
Jan 9, 2004
filing date -
Aug 3, 2001
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Abstract
A programmable time event and waveform generator for the application of precise timing patterns to a logic circuit and the capture of response data from the logic circuit. The time event and waveform generator comprises a programmable delay element that is programmed with values stored in pattern memory. For scan based testing, the time event and waveform generator is programmed between test pattern scan sequences by serial loading from the test pattern memory. The generator may be used to generate precise signal transitions to input pins of a circuit under test, and to capture at precise times the signal states from the output pins of a circuit under test. The data for programming the delay element is accessed from test pattern memory.
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