Method of testing multiple modules on an integrated circuit
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United States of America Patent
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Mar 4, 2008
Grant Date -
Nov 27, 2003
app pub date -
May 15, 2003
filing date -
May 15, 2002
priority date (Note) -
In Force
status (Latency Note)
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Abstract
An integrated circuit (20) comprises a plurality of processing modules (3, 5, 7) which interact during the normal operation of the integrated circuit. Switches (13, 15) are provided on the integrated circuit (20) and operated during a testing procedure to isolate a single module (3) or a group of modules (5, 7) from the other modules, so that that the isolated module or group of modules can be tested. During the testing procedure, the switches (13, 15) provide defined signals at inputs of the isolated module(s) which, when the integrated circuit is in normal operation, are controlled by outputs of the other modules.
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