Testing to prescribe state capture by, and state retrieval from scan registers
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United States of America Patent
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Feb 8, 2011
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app pub date -
Dec 10, 2007
filing date -
Dec 10, 2007
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Abstract
State retention cells of a test circuit embedded in an electrical circuit are interconnected to form one or more scan chains. The scan chains are interconnected so that unknown states, or X-states, are shifted through the scan chains in an order other than the order in which the states were captured by the state retention cells of the scan chain. Such reordering of response states in individual scan chains may be used to align the X-states across multiple scan chains to achieve higher test compression scan register circuit testing.
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