Enhanced logic built-in self-test module and method of online system testing employing the same
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United States of America Patent
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Sep 21, 2010
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Jul 9, 2008
filing date -
Jul 9, 2008
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Abstract
A logic built-in self-test (LBIST) module and a method of online system testing. In one embodiment, the LBIST module includes: (1) first and second data sources selectable to provide alternative respective first and second data to at least one scan chain and (2) a scan clock modifier associated with the first and second data sources and configured to drive the at least one scan chain with a selectively aperiodic modified scan clock signal.
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