Tamper detection device, system, and method

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United States of America Patent

PATENT NO 11768971
SERIAL NO

17022299

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Abstract

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It is described a tamper detection device for detecting tampering with respect to a packaging, the device comprising: i) a first electrode comprising a first patterned structure, and ii) a second electrode comprising a second patterned structure. The first electrode and the second electrode are arranged so that the first patterned structure and the second patterned structure are at least partially opposite to each other. In a first arrangement state of the first patterned structure and the second patterned structure with respect to each other, a first capacitance is measurable, in a second arrangement state of the first patterned structure and the second patterned structure with respect to each other, a second capacitance is measurable, wherein the first capacitance is different from the second capacitance, and wherein the first arrangement state is different from the second arrangement state. The device further comprising: iii) a detection unit, wherein the detection unit is configured to: a) measure the capacitance between the first electrode and the second electrode, b) obtain, based on the measured capacitance, an information indicative of the arrangement state, and c) evaluate, based on the information indicative of the arrangement state, if a tampering with respect to the packaging is detected.

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Patent Owner(s)

  • NXP B.V.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Maier, Stefan Graz, AT 75 818
Suwald, Thomas Hamburg, DE 49 385

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