Semiconductor integrated circuit device and method of testing the same
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United States of America Patent
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May 26, 2009
Grant Date -
Mar 3, 2005
app pub date -
Mar 12, 2004
filing date -
Sep 1, 2003
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A semiconductor integrated circuit device has first and second receivers and first and second transmitters. The first receiver has a first clock data recovery (CDR) circuit, and the second receiver has a second CDR circuit. Each of these first and second CDR circuits receives serial data, recovers a clock from the received serial data, and changes the phase of the generated clock. The first transmitter has a first serializer (SER), and the second transmitter has a second SER. The first SER converts parallel data into serial data synchronized with a transmit clock or the clock generated by the first CDR circuit. The second SER converts parallel data into serial data synchronized with a transmit clock or the clock generated by the second CDR circuit.
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