Method and apparatus for identifying double patterning loop violations

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United States of America Patent

PATENT NO 8719737
SERIAL NO

13555058

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Abstract

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Some embodiments of the invention provide a method for automatically, accurately, and efficiently identifying double patterning (DP) loop violations in an IC design layout. The method of some embodiments identifies DP loop violations in a manner that eliminates false identification of DP loop violations without missing DP loop violations that should be identified. The method of some embodiments also generates a marker for each identified DP loop violation to indicate that a set of shapes associated with the marker forms the DP loop and displays the marker in the design layout.

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Patent Owner(s)

  • CADENCE DESIGN SYSTEMS, INC.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Wang, Xiaojun Cary, US 127 445

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