METHOD FOR CREATING ELECTRON-BEAM HOLOGRAM, MAGNETIC FIELD INFORMATION MEASUREMENT METHOD, AND MAGNETIC FIELD INFORMATION MEASURING DEVICE

Japan Patent

PATENT NO 6786121
APP PUB NO JP-WO2018139220-A1
SERIAL NO

2018564473

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国立大学法人東北大学Not Provided

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佐藤 隆文 東京都板橋区加賀１丁目１４番１号 釜屋化学工業株式会社東京事業本部内
進藤 大輔 -

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