Mercury probe
Number of patents in Portfolio can not be more than 2000
United States of America
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-
Nov 5, 1985
Grant Date -
N/A
app pub date -
Jun 21, 1979
filing date -
Feb 15, 1977
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
The disclosed apparatus provides a mercury electrode for making non-destructive tests, especially for Schottky-diode tests of semi-conductors such as silicon. By developing vacuum under a test wafer on a support, a column of mercury is drawn into contact with the test wafer through a bore in the support that accurately establishes the area of the contact. The vacuum system also holds the test wafer securely in position, it avoids spillage of mercury, and additional circuit-completing contact can be made to the wafer with independently controlled pressure.
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