Apparatus, system, and method for integrated component testing
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United States of America Patent
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Jul 20, 2010
Grant Date -
Mar 26, 2009
app pub date -
Sep 21, 2007
filing date -
Sep 21, 2007
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Abstract
An apparatus, system, and method are disclosed for integrating component testing. A voltage module modifies a reference voltage integral to an electronic device to a plurality of reference voltage values. A test module tests a component of the electronic device at each of the plurality of reference voltage values. In addition, the test module determines a voltage range for the component, wherein the voltage range comprises voltage values between a high voltage failure and a low voltage failure. An optimization module sets the reference voltage value to within the voltage range.
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