Apparatus, system, and method for integrated component testing

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United States of America Patent

PATENT NO 7759958
APP PUB NO 20090079456A1
SERIAL NO

11859540

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Abstract

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An apparatus, system, and method are disclosed for integrating component testing. A voltage module modifies a reference voltage integral to an electronic device to a plurality of reference voltage values. A test module tests a component of the electronic device at each of the plurality of reference voltage values. In addition, the test module determines a voltage range for the component, wherein the voltage range comprises voltage values between a high voltage failure and a low voltage failure. An optimization module sets the reference voltage value to within the voltage range.

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Patent Owner(s)

Patent OwnerAddress
LENOVO INTERNATIONAL LIMITED23/F LINCOLN HOUSE TAIKOO PLACE 979 KING'S ROAD QUARRY BAY

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cases, Moises Austin, US 88 764
Dasari, Shiva R Austin, US 39 328
Matoglu, Erdem Austin, US 16 63
Mutnury, Bhyrav M Austin, US 179 518
Pham, Nam H Round Rock, US 52 154

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