METHOD AND MACHINE FOR MULTIDIMENSIONAL TESTING OF AN ELECTRONIC DEVICE ON THE BASIS OF A MONODIRECTIONAL PROBE

World Intellectual Property Organization Patent

APP PUB NO WO-2010004167-A2
SERIAL NO

PCTFR2009051204

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The invention relates to a method and a machine for testing an electronic device, in which the magnetic field emitted is measured by a monodirectional measurement probe (46) characterized in that: - a first value (BzI) of the componant Bz of the magnetic field along the axis ZZ' is measured by the probe (46) and recorded, then the probe (46) and the electronic device are displaced with respect to one another by relative pivoting about an axis XX' orthogonal to the axis ZZ', according to an angular amplitude of less than 90° while being kept at the same distance d0 and, for each position (x, y) of the axis ZZ', a second value (Bz2) of the component Bz of the magnetic field along the axis ZZ' is measured by the probe (46) and recorded, then the value of a component By of the magnetic field along an axis YY' orthogonal to the axes ZZ' and XX' is determined and recorded on the basis of the first value (BzI) and of the second value (Bz2) obtained.

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