TRANSFORMER TEST DEVICE AND METHOD FOR TESTING A TRANSFORMER

World Intellectual Property Organization Patent

APP PUB NO WO-2016066701-A1
SERIAL NO

PCTEP2015075018

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Abstract

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The invention relates to a transformer test device (10) for testing a transformer (40), comprising connections (12) for the releasable connection of the transformer test device (10) to the transformer (40). The transformer test device (10) has a source (13) for generating a test signal for the testing of the transformer (40). The transformer test device (10) comprises a controllable switching means (15) which is connected to the terminals (12) during a transformer test for short-circuiting at least one winding (42) of the transformer (40).

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Patent Owner(s)

Patent OwnerAddress
OMICRON ELECTRONICS GMBHAT6833 KLAUS

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Inventor(s)

Inventor Name Address
UNTERER BORIS ARDETZENBERGSTRASSE 59 6800 FELDKIRCH 6800
KAUFMANN REINHARD 6721 THÜRINGERBERG
PUTTER MARKUS 6832 SULZ

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