G01B

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Description

MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS

Subclasses

Not Available
Subclass Title
1/00 Measuring instruments characterised by the selection of material therefor
3/00 Instruments as specified in the subgroups and characterised by the use of mechanical measuring means (arrangements for measuring particular parameters G01B 5/00; devices of general interest specially adapted or mounted for storing and repeatedly paying-out and re-storing lengths of material B65H 75/34)
3/02 Instruments as specified in the subgroups and characterised by the use of mechanical measuring means (arrangements for measuring particular parameters G01B 5/00; devices of general interest specially adapted or mounted for storing and repeatedly paying-out and re-storing lengths of material B65H 75/34) Rulers or tapes with scales or marks for direct reading
3/04 Instruments as specified in the subgroups and characterised by the use of mechanical measuring means (arrangements for measuring particular parameters G01B 5/00; devices of general interest specially adapted or mounted for storing and repeatedly paying-out and re-storing lengths of material B65H 75/34) Rulers or tapes with scales or marks for direct reading rigid
3/06 Instruments as specified in the subgroups and characterised by the use of mechanical measuring means (arrangements for measuring particular parameters G01B 5/00; devices of general interest specially adapted or mounted for storing and repeatedly paying-out and re-storing lengths of material B65H 75/34) Rulers or tapes with scales or marks for direct reading rigid folding

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Recent Patents

Not Available
Patent #TitleFiling DateIssue DatePatent Owner
9995816 Methods for indoor positioning and apparatuses using the same Jan 14, 15 Jun 12, 18 , Wistron Corp.
9996647 Methods and apparatuses for etch profile optimization by reflectance spectra matching and surface kinetic model optimization Sep 07, 17 Jun 12, 18 , Lam Research Corporation
9998729 Method and system for three dimensional imaging and analysis Dec 12, 14 Jun 12, 18 , Not available
9995567 Method and device for determining 3D coordinates of an object Dec 06, 12 Jun 12, 18 , HEXAGON TECHNOLOGY CENTER GMBH
9995568 Construction site monitoring system Oct 06, 16 Jun 12, 18 , Not available
9995575 System and method for improving orientation data Jul 25, 16 Jun 12, 18 , QUALCOMM Incorporated
9995572 Elevation angle estimating device and method for user terminal placement Mar 31, 15 Jun 12, 18 , World Vu Satellites Limited
9996085 Automatic guiding system for analyzing pavement curvature and method for the same Jun 24, 16 Jun 12, 18 , Hon Hai Precision Industry Co., Ltd
9993321 Gauge system for measuring underbite and overbite in ruminants May 29, 17 Jun 12, 18 , Not available
9995579 Long base inclinometer with optical measurement Dec 02, 13 Jun 12, 18 , Centre National de la Recherche Scientific (CNRS); l'Universite de Montpellier I;
9995628 Fiber-optic temperature and flow sensor system and methods May 16, 16 Jun 12, 18 , Nutech Ventures
9993152 Image processing apparatus and image processing method Sep 01, 15 Jun 12, 18 , CANON KABUSHIKI KAISHA
9995671 Tactile sensor system and method for inspecting the condition of a structure Apr 26, 17 Jun 12, 18 , State Farm Mutual Automobile Insurance Company
9993977 System for using an optical sensor array to monitor color fidelity in objects produced by a three-dimensional object printer Oct 01, 15 Jun 12, 18 , Xerox Corporation
9995565 Optical coherence tomography using polarization information Apr 21, 16 Jun 12, 18 , TOMEY CORPORATION
9995690 Systems and methods for constructing and testing composite photonic structures Nov 07, 17 Jun 12, 18 , Saudi Arabian Oil Company
9995790 Customizable contactor prognostics system Jan 23, 12 Jun 12, 18 , Rockwell Automation Technologies Inc.
9995569 Six-degree-of-freedom displacement measurement method for exposure region on silicon wafer stage Mar 15, 16 Jun 12, 18 , 501 Tsinghua University; BEIJING U-PRECISION TECH CO., LTD.;
9995624 Optical measurement device Nov 29, 16 Jun 12, 18 , Omron Corporation
9996014 Optical imaging device with image defect determination Jan 11, 16 Jun 12, 18 , Carl Zeiss SMT GmbH

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Recent Publications

Not Available
Publication #TitleFiling DatePub DatePatent Owner
2018/0164,183 A METHOD AND A DEVICE FOR DETERMINING TORSIONAL DEFORMATION IN A DRIVETRAIN Jun 17, 16 Jun 14, 18 , Not available
2018/0165,404 Apparatus and Method for the Measurement of Pattern Placement and Size of Pattern and Computer Program Therefor Jun 27, 16 Jun 14, 18 , Not available
2018/0164,096 DYNAMIC DIMENSIONAL MEASUREMENT SYSTEM Dec 12, 16 Jun 14, 18 , The Boeing Company
2018/0160,882 SHAPE DETECTION DEVICE Jan 10, 18 Jun 14, 18 , OLYMPUS CORPORATION
2018/0164,091 DEVICE FOR MEASURING GAP AND STEP FOR VEHICLE, AND SYSTEM FOR MEASURING GAP AND STEP INCLUDING THE SAME Jun 23, 17 Jun 14, 18 , Hyundai Motor Company; Hyundai Motor Company & Kia Motors Corporation;
2018/0164,150 METHOD AND DEVICE FOR DETERMINING THE VIBRATION OF ROTOR BLADES Jun 09, 16 Jun 14, 18 , SAFRAN AIRCRAFT ENGINES
2018/0161,622 METHOD OF DETECTING AND CALCULATING HEIGHT OF A JUMP Dec 05, 17 Jun 14, 18 , The Swatch Group Research and Development Ltd.
2018/0164,093 APPARATUS AND METHODS FOR MONITORING MOVEMENT OF PHYSICAL STRUCTURES BY LASER DEFLECTION Feb 07, 18 Jun 14, 18 , Intelligent Structures, Inc.
2018/0164,159 PHOTO-DETECTION APPARATUS INCLUDING LIGHT-SHIELDING FILM, OPTICALLY-COUPLED LAYER, PHOTODETECTOR, AND OPTICAL SYSTEM Nov 28, 17 Jun 14, 18 , Not available
2018/0162,117 METHOD FOR MANUFACTURING ANGLE AND CURVATURE DETECTION SENSOR, AND SENSOR Nov 26, 14 Jun 14, 18 , INDUSTRY-ACADEMY COOPERATION CORPS OF SUNCHON NATIONAL UNIVERSITY
2018/0164,188 DEVICE FOR MEASURING TIRE GROUND STATE Dec 08, 17 Jun 14, 18 , TOYO TIRE & RUBBER CO., LTD.
2018/0164,471 YIELD ESTIMATION Feb 10, 18 Jun 14, 18 , Not available
2018/0164,092 GAP MEASURING DEVICE AND GAP MANAGEMENT SYSTEM Jul 11, 16 Jun 14, 18 , Not available
2018/0161,896 PROCESS FOR GEAR MANUFACTURING MACHINING Apr 27, 17 Jun 14, 18 , Not available
2018/0164,506 INTERFEROMETER BASED ON A TILTED MMI Dec 12, 17 Jun 14, 18 , Ciena Corporation
2018/0161,894 ONBOARD MEASURING SYSTEM FOR MITER SAWS Feb 12, 18 Jun 14, 18 , Not available
2018/0164,089 DISTANCE MEASURING DEVICE AND METHOD FOR MEASURING DISTANCES Feb 15, 17 Jun 14, 18 , Not available
2018/0164,095 APPARATUS AND METHOD FOR CHECKING WHETHER TABLE IS AT TILT Sep 13, 17 Jun 14, 18 , ISMEDIA CO., LTD.
2018/0164,160 PHOTO-DETECTION SYSTEM COMPRISING PHOTO-DETECTION APPARATUS INCLUDING LIGHT-SHIELDING FILM, OPTICALLY-COUPLED LAYER, AND PHOTODETECTOR AND ARITHMETIC CIRCUIT Dec 01, 17 Jun 14, 18 , Not available
2018/0161,107 SYSTEM AND METHOD FOR SENSING TISSUE DEFORMATION Feb 07, 18 Jun 14, 18 , Not available

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Patents Issued To Date - By Filing Year

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