G01B

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Description

MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS

Subclasses

Not Available
Subclass Title
1/00 Measuring instruments characterised by the selection of material therefor
3/00 Instruments as specified in the subgroups and characterised by the use of mechanical measuring means (arrangements for measuring particular parameters G01B 5/00; devices of general interest specially adapted or mounted for storing and repeatedly paying-out and re-storing lengths of material B65H 75/34)
3/02 Instruments as specified in the subgroups and characterised by the use of mechanical measuring means (arrangements for measuring particular parameters G01B 5/00; devices of general interest specially adapted or mounted for storing and repeatedly paying-out and re-storing lengths of material B65H 75/34) Rulers or tapes with scales or marks for direct reading
3/04 Instruments as specified in the subgroups and characterised by the use of mechanical measuring means (arrangements for measuring particular parameters G01B 5/00; devices of general interest specially adapted or mounted for storing and repeatedly paying-out and re-storing lengths of material B65H 75/34) Rulers or tapes with scales or marks for direct reading rigid
3/06 Instruments as specified in the subgroups and characterised by the use of mechanical measuring means (arrangements for measuring particular parameters G01B 5/00; devices of general interest specially adapted or mounted for storing and repeatedly paying-out and re-storing lengths of material B65H 75/34) Rulers or tapes with scales or marks for direct reading rigid folding

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Recent Patents

Not Available

Recent Publications

Not Available
Publication #TitleFiling DatePub DatePatent Owner
2018/0347,081 ELECTRICAL RESISTANCE-VARIABLE CONDUCTIVE ELASTICIZED KNITTED FABRIC AND CONDUCTIVE PART Jun 20, 16 Dec 06, 18 , GUNZE LIMITED
2018/0349,689 METHODS AND APPARATUS TO MONITOR ENVIRONMENTS Aug 07, 18 Dec 06, 18 , Not available
2018/0347,974 A bracket for wheel alignment control instruments for vehicle wheels Dec 01, 16 Dec 06, 18 , Not available
2018/0347,965 OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD Jun 04, 18 Dec 06, 18 , Otsuka Electronics Co., Ltd.
2018/0348,439 FIBER OPTIC ROTARY JOINTS AND METHODS OF USING AND MANUFACTURING SAME Apr 27, 18 Dec 06, 18 , Not available
2018/0348,022 SENSOR MOUNTING STRUCTURE AND SENSOR ADAPTOR Feb 08, 18 Dec 06, 18 , Omron Corporation
2018/0345,198 SYSTEM AND METHOD FOR CONDITION-BASED MONITORING OF FILTERS May 30, 17 Dec 06, 18 , Not available
2018/0346,004 PROFILE DETECTION METHOD Aug 10, 18 Dec 06, 18 , Not available
2018/0347,973 GAP MEASUREMENT DEVICE AND GAP MEASUREMENT METHOD Nov 24, 16 Dec 06, 18 , Not available
2018/0347,971 SYSTEMS, METHODS, AND MEDIA FOR PERFORMING SHAPE MEASUREMENT Dec 22, 17 Dec 06, 18 , Not available
2018/0347,960 OPTICAL SECTIONING APPARATUS USING ADVANCED OPTICAL INTERFERENCE MICROSCOPY Aug 17, 17 Dec 06, 18 , Not available
2018/0350,640 VAPOR SHIELD REPLACEMENT SYSTEM AND METHOD Oct 31, 17 Dec 06, 18 , Not available
2018/0348,171 Acoustic Measurement of Fabrication Equipment Clearance Jul 27, 18 Dec 06, 18 , Not available
2018/0346,281 Cable-Winding Apparatus May 30, 17 Dec 06, 18 , Not available
2018/0347,907 METHOD FOR DETERMINING THE STATE OF A REFRACTORY LINING OF A METALLURGICAL VESSEL FOR MOLTEN METAL IN PARTICULAR Jun 07, 18 Dec 06, 18 , Refractory Intellectual Property GmbH & Co. KG
2018/0348,638 EXPOSURE METHOD, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD Aug 08, 18 Dec 06, 18 , Nikon Corporation
2018/0347,963 TERAHERTZ MEASUREMENT METHOD AND TERAHERTZ MEASURING APPARATUS FOR ASCERTAINING A LAYER THICKNESS OR A DISTANCE OF A MEASUREMENT OBJECT Dec 12, 16 Dec 06, 18 , INOEX GmbH Innovationen und Ausruestungen fuer die Extrusionstechnik
2018/0347,962 DEVICE, METHOD AND APPARATUS FOR MEASURING SIZE OF OBJECT Mar 28, 16 Dec 06, 18 , Not available
2018/0348,645 Metrology Apparatus, Lithographic System, And Method Of Measuring A Structure May 24, 18 Dec 06, 18 , ASML Netherlands B.V.
2018/0348,703 METHODS AND SYSTEMS OF HOLOGRAPHIC INTERFEROMETRY Jun 06, 17 Dec 06, 18 , Not available

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Patents Issued To Date - By Filing Year

Average Time to Issuance

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