Description
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
G01Q
Technology
Stats
- 1,142 US PATENTS IN FORCE
- 332 US APPLICATIONS PENDING
- 382 Total Patent Owners
- 3,023 TOTAL INVENTORS
Subclasses
| Subclass | Title |
|---|---|
| 10/00 | Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe |
| 10/02 | Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe Coarse scanning or positioning |
| 10/04 | Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe Fine scanning or positioning |
| 10/06 | Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe Fine scanning or positioning Circuits or algorithms therefor |
| 20/00 | Monitoring the movement or position of the probe |
| 20/02 | Monitoring the movement or position of the probe by optical means |
| 20/04 | Monitoring the movement or position of the probe Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezo-electric gauge |
| 30/00 | Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices |
| 30/02 | Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope |
| 30/04 | Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices Display or data processing devices |
| 30/06 | Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices Display or data processing devices for error compensation |
| 30/08 | Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices Means for establishing or regulating a desired environmental condition within a sample chamber |
| 30/10 | Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices Means for establishing or regulating a desired environmental condition within a sample chamber Thermal environment |
| 30/12 | Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices Means for establishing or regulating a desired environmental condition within a sample chamber Fluid environment |
| 30/14 | Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices Means for establishing or regulating a desired environmental condition within a sample chamber Fluid environment Liquid environment |
| 30/16 | Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices Means for establishing or regulating a desired environmental condition within a sample chamber Vacuum environment |
| 30/18 | Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g. vibrations or electromagnetic fields |
| 30/20 | Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices Sample handling devices or methods |
| 40/00 | Calibration, e.g. of probes |
| 40/02 | Calibration, e.g. of probes Calibration standards or methods of fabrication thereof |
Recent Patents
Not Available
Recent Publications
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2025/0110,152 | METHOD FOR CHARACTERIZING INTERACTION FORCE BETWEEN LIGNIN AND CELLULASE | Aug 31, 23 | Apr 03, 25 | Nanjing Forestry University |
Top Owners in This Class
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Applications Filed in This Class - By Year
Patents Issued To Date - By Filing Year
Average Time to Issuance
- 31 Months (last 2 years Issuances)
- 31 Months (last 5 years Issuances)