G01R

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Description

MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (measuring physical variables of any kind by conversion into electric variables, see Note (4) following the title of class G01; measuring diffusion of ions in an electric field, e.g. electrophoresis, electro-osmosis, G01N; investigating non-electric or non-magnetic properties of materials by using electric or magnetic methods G01N; indicating correct tuning of resonant circuits H03J 3/12; monitoring electronic pulse counters H03K 21/40; monitoring operation of communication systems H04)

Recent Patents

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Patent #TitleFiling DateIssue DatePatent Owner
8,446,143 Self-calibration circuit with gyrated output impedance Mar 06, 09 May 21, 13 , NATIONAL INSTRUMENTS CORPORATION
8,446,144 Frequency characteristics measuring device Dec 15, 08 May 21, 13 , ADVANTEST CORPORATION
8,446,145 Method for measuring I-V characteristics of solar cell, and solar cell Feb 05, 10 May 21, 13 , SANYO ELECTRIC CO LTD.
8,446,151 Protective device Dec 05, 11 May 21, 13 , PASS & SEYMOUR, INC.
8,446,152 Printed circuit board test assisting apparatus, printed circuit board test assisting method, and computer-readable information recording medium Jun 25, 10 May 21, 13 , FUJITSU LIMITED
8,446,153 Adaptor failure tolerance test device Apr 13, 11 May 21, 13 , HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.; HON HAI PRECISION INDUSTRY CO., LTD;
8,446,155 Analog circuit test device Aug 05, 08 May 21, 13 , DOLPHIN INTEGRATION
8,446,156 Rock analysis apparatus and method Aug 10, 07 May 21, 13 , THE UNIVERSITY OF QUEENSLAND
8,446,157 Capacitance meter, method, computer program and computer program product for improved capacitance measurement Sep 17, 10 May 21, 13 , ABB TECHNOLOGY AG
8,446,158 Compensation for parasitic capacitance of a capacitive sensor Nov 07, 08 May 21, 13 , CYPRESS SEMICONDUCTOR CORPORATION
8,446,159 Current sensor using leadframe as sensing element Jun 30, 10 May 21, 13 , LINEAR TECHNOLOGY CORPORATION
8,446,160 Probe card maintenance method which adjusts position/posture of probes Feb 01, 10 May 21, 13 , OKI SEMICONDUCTOR CO., LTD.
8,446,161 Method of self monitoring and self repair for a semiconductor IC Nov 24, 09 May 21, 13 , TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
8,446,162 Semiconductor integrated circuit device with test circuit and test method therefor Nov 21, 08 May 21, 13 , NEC CORPORATION
8,446,163 Test circuit and test method for testing differential input circuit Feb 03, 10 May 21, 13 , RENESAS ELECTRONICS CORPORATION
8,446,164 Semiconductor device test system having high fidelity tester access fixture (HIFIX) board Oct 17, 08 May 21, 13 , INTERNATIONAL TRADING & TECHNOLOGY CO., LTD.
8,446,165 Link analysis compliance and calibration verification for automated printed wiring board test systems Dec 20, 10 May 21, 13 , MAYO FOUNDATION FOR MEDICAL EDUCATION AND RESEARCH
8,446,223 Systems and methods for calibrating real time clock May 22, 09 May 21, 13 , CSR TECHNOLOGY INC.
8,446,815 -cycles Dec 22, 05 May 21, 13 , TELECOMMUNICATIONS RESEARCH LABORATORIES
8,446,816 Control method for access gateway and communication system Jun 15, 09 May 21, 13 , HITACHI COMMUNICATION TECHNOLOGIES, LTD.

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Recent Publications

Not Available
Publication #TitleFiling DatePub DatePatent Owner
2013/0127,362 EMERGENCY LIGHTING SYSTEMS AND METHODS FOR SOLID STATE LIGHTING APPARATUS May 08, 12 May 23, 13 , Not available
2013/0127,390 System, Method and Apparatus for Computing, Monitoring, Measuring, Optimizing and Allocating Power and Energy for a Rod Pumping System Aug 31, 12 May 23, 13 , Not available
2013/0127,440 PASS THROUGH DEVICE FOR NON-CONTACT VOLTAGE DETECTORS Nov 17, 11 May 23, 13 , GRACE ENGINEERED PRODUCTS, INC.
2013/0127,441 APPARATUS AND METHOD FOR ON-CHIP SAMPLING OF DYNAMIC IR VOLTAGE DROP Nov 18, 11 May 23, 13 , TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD.
2013/0127,442 ELECTRONIC CIRCUIT COMPONENT AUTHENTICITY DETERMINATION METHOD Jan 22, 13 May 23, 13 , NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
2013/0127,443 ELECTRIC POWER MANAGEMENT APPARATUS AND ELECTRIC POWER MANAGEMENT METHOD Nov 05, 12 May 23, 13 , SONY CORPORATION OF JAPAN
2013/0127,445 TEST FIXTURE WITH LOAD Dec 21, 11 May 23, 13 , HON HAI PRECISION INDUSTRY CO., LTD.; HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.;
2013/0127,446 CURRENT MEASURING APPARATUS Dec 01, 10 May 23, 13 , BROADCOM EUROPE LIMITED
2013/0127,448 Smart Electromagnetic Sensor Array Nov 16, 12 May 23, 13 , FLUKE CORPORATION
2013/0127,453 ELECTRONIC DEVICE COMPRISING HALL EFFECT REGION WITH THREE CONTACTS Nov 17, 11 May 23, 13 , INFINEON TECHNOLOGIES AG
2013/0127,454 MAGNETIC FIELD SENSOR INCLUDING AN ANISOTROPIC MAGNETORESISTIVE MAGNETIC SENSOR AND A HALL MAGNETIC SENSOR Nov 21, 12 May 23, 13 , STMICROELECTRONICS S.E.I.
2013/0127,455 MAGNETIC FIELD VECTOR SENSOR Nov 14, 12 May 23, 13 , INSTITUT POLYTECHNIQUE DE GRENOBLE; COMMISSARIAT A I'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES;
2013/0127,456 MAGNETIC BALANCE TYPE CURRENT SENSOR Jan 16, 13 May 23, 13 , ALPS GREEN DEVICES CO., LTD.
2013/0127,457 MAGNETIC SUBSTANCE DETECTION DEVICE May 12, 11 May 23, 13 , MITSUBISHI ELECTRIC CORPORATION
2013/0127,458 MAGNETIC GRADIOMETER AND MAGNETIC SENSING METHOD Aug 01, 11 May 23, 13 , CANON KABUSHIKI KAISHA
2013/0127,459 MAGNETIC RESONANCE IMAGING METHOD AND APPARATUS Nov 04, 12 May 23, 13 , SAMSUNG ELECTRONICS CO., LTD.
2013/0127,460 MR IMAGING USING NAVIGATORS Oct 26, 10 May 23, 13 , KONINKLIJKE PHILIPS ELECTRONICS N.V.
2013/0127,461 MRT System, Receive Apparatus for an MRT System and Method for Obtaining an MR Signal in an MRT System Nov 16, 12 May 23, 13 , Not available
2013/0127,462 Method for Operating a Receiving Device for Magnetic Resonance Image Signals of a Body Nov 16, 12 May 23, 13 , Not available
2013/0127,463 Magnetic Resonance Antenna Arrangement and Magnetic Resonance System Nov 21, 12 May 23, 13 , Not available

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Top Owners in This Class

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Patents Filed in This Class - By Year