|
8,446,143
|
Self-calibration circuit with gyrated output impedance |
Mar 06, 09 |
May 21, 13 |
, NATIONAL INSTRUMENTS CORPORATION |
|
8,446,144
|
Frequency characteristics measuring device |
Dec 15, 08 |
May 21, 13 |
, ADVANTEST CORPORATION |
|
8,446,145
|
Method for measuring I-V characteristics of solar cell, and solar cell |
Feb 05, 10 |
May 21, 13 |
, SANYO ELECTRIC CO LTD. |
|
8,446,151
|
Protective device |
Dec 05, 11 |
May 21, 13 |
, PASS & SEYMOUR, INC. |
|
8,446,152
|
Printed circuit board test assisting apparatus, printed circuit board test assisting method, and computer-readable information recording medium |
Jun 25, 10 |
May 21, 13 |
, FUJITSU LIMITED |
|
8,446,153
|
Adaptor failure tolerance test device |
Apr 13, 11 |
May 21, 13 |
, HONG FU JIN PRECISION INDUSTRY (SHENZHEN) CO., LTD.; HON HAI PRECISION INDUSTRY CO., LTD; |
|
8,446,155
|
Analog circuit test device |
Aug 05, 08 |
May 21, 13 |
, DOLPHIN INTEGRATION |
|
8,446,156
|
Rock analysis apparatus and method |
Aug 10, 07 |
May 21, 13 |
, THE UNIVERSITY OF QUEENSLAND |
|
8,446,157
|
Capacitance meter, method, computer program and computer program product for improved capacitance measurement |
Sep 17, 10 |
May 21, 13 |
, ABB TECHNOLOGY AG |
|
8,446,158
|
Compensation for parasitic capacitance of a capacitive sensor |
Nov 07, 08 |
May 21, 13 |
, CYPRESS SEMICONDUCTOR CORPORATION |
|
8,446,159
|
Current sensor using leadframe as sensing element |
Jun 30, 10 |
May 21, 13 |
, LINEAR TECHNOLOGY CORPORATION |
|
8,446,160
|
Probe card maintenance method which adjusts position/posture of probes |
Feb 01, 10 |
May 21, 13 |
, OKI SEMICONDUCTOR CO., LTD. |
|
8,446,161
|
Method of self monitoring and self repair for a semiconductor IC |
Nov 24, 09 |
May 21, 13 |
, TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
|
8,446,162
|
Semiconductor integrated circuit device with test circuit and test method therefor |
Nov 21, 08 |
May 21, 13 |
, NEC CORPORATION |
|
8,446,163
|
Test circuit and test method for testing differential input circuit |
Feb 03, 10 |
May 21, 13 |
, RENESAS ELECTRONICS CORPORATION |
|
8,446,164
|
Semiconductor device test system having high fidelity tester access fixture (HIFIX) board |
Oct 17, 08 |
May 21, 13 |
, INTERNATIONAL TRADING & TECHNOLOGY CO., LTD. |
|
8,446,165
|
Link analysis compliance and calibration verification for automated printed wiring board test systems |
Dec 20, 10 |
May 21, 13 |
, MAYO FOUNDATION FOR MEDICAL EDUCATION AND RESEARCH |
|
8,446,223
|
Systems and methods for calibrating real time clock |
May 22, 09 |
May 21, 13 |
, CSR TECHNOLOGY INC. |
|
8,446,815
|
-cycles |
Dec 22, 05 |
May 21, 13 |
, TELECOMMUNICATIONS RESEARCH LABORATORIES |
|
8,446,816
|
Control method for access gateway and communication system |
Jun 15, 09 |
May 21, 13 |
, HITACHI COMMUNICATION TECHNOLOGIES, LTD. |