H01J

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Description

ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; arc lamps with consumable electrodes H05B; particle accelerators H05H)

Recent Patents

Not Available
Patent #TitleFiling DateIssue DatePatent Owner
8,894,229 Backlight assembly and a display device having the same Aug 31, 09 Nov 25, 14 , SAMSUNG DISPLAY CO., LTD
8,894,458 Thin film deposition apparatus, method of manufacturing organic light-emitting display device by using the apparatus, and organic light-emitting display device manufactured by using the method Apr 25, 11 Nov 25, 14 , SAMSUNG DISPLAY CO., LTD.
8,894,767 Flow control features of CVD chambers Jul 15, 10 Nov 25, 14 , APPLIED MATERIALS INC.
8,894,796 Nanopore fabrication and applications thereof Jun 06, 12 Nov 25, 14 , THE UNIVERSITY OF NORTH CAROLINA AT GREENSBORO; CARL ZEISS NTS, LLC.;
8,894,805 Electron beam plasma source with profiled magnet shield for uniform plasma generation Aug 27, 12 Nov 25, 14 , APPLIED MATERIALS INC.
8,895,116 Manufacturing method of crystalline semiconductor film and manufacturing method of semiconductor device Oct 28, 11 Nov 25, 14 , SEMICONDUCTOR ENERGY LABORATORY CO., LTD
8,895,212 Method and system for forming a pattern using charged particle beam lithography with multiple exposure passes with different dosages Jul 19, 13 Nov 25, 14 , D2S, INC.
8,895,915 Ion detection arrangement Jul 14, 11 Nov 25, 14 , THERMO FISHER SCIENTIFIC (BREMEN) GMBH
8,895,917 Method of mass spectrometry and a mass spectrometer Mar 27, 13 Nov 25, 14 , WATERS TECHNOLOGIES CORPORATION
8,895,918 Ion generation using modified wetted porous materials Jun 01, 12 Nov 25, 14 , PURDUE RESEARCH FOUNDATION
8,895,920 Mass spectrometer with beam expander Jun 07, 11 Nov 25, 14 , MICROMASS UK LIMITED
8,895,921 Inspection apparatus and replaceable door for a vacuum chamber of such an inspection apparatus and a method for operating an inspection apparatus Jul 14, 11 Nov 25, 14 , DELMIC B.V.
8,895,923 System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing Nov 18, 13 Nov 25, 14 , DCG SYSTEMS, INC.
8,895,943 Lithography system and method of processing substrates in such a lithography system Dec 13, 11 Nov 25, 14 , MAPPER LITHOGRAPHY IP B.V.
8,895,944 Scan head and scan arm using the same Jan 18, 13 Nov 25, 14 , ADVANCED ION BEAM TECHNOLOGY, INC.
8,895,945 Dose measurement device for plasma-immersion ion implantation Jun 01, 11 Nov 25, 14 , ION BEAM SERVICES
8,895,947 Ultraviolet light generating target, electron-beam-excited ultraviolet light source, and method for producing ultraviolet light generating target Apr 24, 12 Nov 25, 14 , HAMAMATSU PHOTONICS K.K.
8,896,191 Mercury-free discharge lamp Jul 11, 11 Nov 25, 14 , OSRAM SYLVANIA INC.
8,896,195 Filament for electron source Oct 21, 10 Nov 25, 14 , HERMES MICROVISION INC. (TAIWAN)
8,896,196 Field emitting flat light source and method for making the same Aug 17, 10 Nov 25, 14 , OCEAN'S KING LIGHTING SCIENCE & TECHNOLOGY CO., LTD.

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Recent Publications

Not Available
Publication #TitleFiling DatePub DatePatent Owner
2014/0339,414 DC ION FUNNELS Nov 28, 12 Nov 20, 14 , Not available
2014/0339,415 INSTRUMENT FOR SIZING NANOPARTICLES AND A COMPONENT THEREFOR Jan 18, 13 Nov 20, 14 , Not available
2014/0339,416 METHOD AND APPARATUS TO IMPROVE THE SEPARATION CAPACITY IN A SEQUENCE OF ION FILTERS INCORPORATING AT LEAST TWO ION MOBILITY ANALYZERS May 20, 14 Nov 20, 14 , SOCIEDAD EUROPEA DE ANALISIS DIFERENCIAL DE MOVILIDAD
2014/0339,417 SYSTEMS, DEVICES, AND METHODS FOR SAMPLE ANALYSIS USING MASS SPECTROMETRY Dec 05, 12 Nov 20, 14 , SMITHS DETECTION MONTREAL INC.
2014/0339,418 Mass Spectrometer Vacuum Interface Method and Apparatus Dec 12, 12 Nov 20, 14 , Not available
2014/0339,419 HIGH RESOLUTION TIME-OF-FLIGHT MASS SPECTROMETER Dec 04, 12 Nov 20, 14 , Not available
2014/0339,420 ATMOSPHERIC PRESSURE ION SOURCE BY INTERACTING HIGH VELOCITY SPRAY WITH A TARGET Aug 05, 14 Nov 20, 14 , Not available
2014/0339,421 MULTINOTCH ISOLATION FOR MS3 MASS ANALYSIS Jan 24, 13 Nov 20, 14 , Not available
2014/0339,422 MASS SPECTROMETER Nov 22, 11 Nov 20, 14 , SHIMADZU CORPORATION
2014/0339,423 ULTRAVIOLET DIODE AND ATOMIC MASS ANALYSIS IONIZATION SOURCE COLLECTING DEVICE USING ULTRAVIOLET DIODE AND AN MCP Dec 16, 11 Nov 20, 14 , KOREA BASIC SCIENCE INSTITUTE
2014/0339,424 DEVICE FOR MASS SELECTIVE DETERMINATION OF AN ION May 15, 14 Nov 20, 14 , CARL ZEISS MICROSCOPY GMBH
2014/0339,425 SCANNING ELECTRON BEAM DEVICE AND DIMENSION MEASUREMENT METHOD USING SAME Nov 26, 12 Nov 20, 14 , Not available
2014/0339,433 Neutron Detection Aug 01, 14 Nov 20, 14 , Not available
2014/0339,435 SYSTEM FOR DETECTING AND COUNTING IONS Dec 11, 12 Nov 20, 14 , Not available
2014/0339,436 BACK SCATTERED ELECTRON DETECTOR May 24, 14 Nov 20, 14 , Not available
2014/0339,441 AEROSOL IONIZER May 16, 14 Nov 20, 14 , BRECHTEL MANUFACTURING, INC.
2014/0339,545 SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING THE SAME, AND APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE May 14, 14 Nov 20, 14 , SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
2014/0339,980 ELECTRON BEAM PLASMA SOURCE WITH REMOTE RADICAL SOURCE Jun 18, 14 Nov 20, 14 , Not available
2014/0339,981 ANTENNA FOR PLASMA GENERATION, PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD Dec 05, 12 Nov 20, 14 , Not available
2014/0338,432 METHODS OF SEPARATING LIPIDS Apr 11, 14 Nov 20, 14 , WATERS TECHNOLOGIES CORPORATION

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