H01J

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Description

ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; arc lamps with consumable electrodes H05B; particle accelerators H05H)

Subclasses

Not Available
Subclass Title
1/00 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00)
1/02 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00) Main electrodes
1/04 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00) Main electrodes Liquid electrodes, e.g. liquid cathode
1/05 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00) Main electrodes Liquid electrodes, e.g. liquid cathode characterised by material
1/06 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00) Main electrodes Liquid electrodes, e.g. liquid cathode Containers for liquid-pool electrodes; Arrangement or mounting thereof

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Recent Patents

Not Available
Patent #TitleFiling DateIssue DatePatent Owner
9603956 Dynamic enhanced and diffuse broad spectrum UVC or alternative controlled ionizing radiation source emitters for mobile and fixed placement disinfection of clinical surfaces Dec 12, 14 Mar 28, 17 , Not available
9604249 Innovative top-coat approach for advanced device on-wafer particle performance Feb 05, 13 Mar 28, 17 , APPLIED MATERIALS INC.
9605201 Wavelength conversion member and light emitting device using the same Feb 06, 15 Mar 28, 17 , STANLEY ELECTRIC CO. LTD.
9605341 Physical vapor deposition RF plasma shield deposit control Mar 06, 13 Mar 28, 17 , APPLIED MATERIALS, INC.
9605342 Process gas management for an inductively-coupled plasma deposition reactor Mar 16, 15 Mar 28, 17 , ASM IP HOLDING B.V.
9606082 Pressure driven microfluidic injection for chemical separations Jan 04, 16 Mar 28, 17 , THE UNIVERSITY OF NORTH CAROLINA AT CHAPEL HILL
9606101 Deep MALDI TOF mass spectrometry of complex biological samples, e.g., serum, and uses thereof Sep 29, 15 Mar 28, 17 , BIODESIX, INC.
9606181 Processing apparatus, ion implantation apparatus and ion implantation method Jan 29, 16 Mar 28, 17 , TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
9606231 Optoelectronic apparatus Aug 22, 13 Mar 28, 17 , OSRAM OPTO SEMICONDUCTORS GMBH
9606259 X-ray tomographic inspection system for the identification of specific target items Sep 08, 15 Mar 28, 17 , RAPISCAN SYSTEMS, INC.
9606306 Optical signal coupling assembly Aug 31, 15 Mar 28, 17 , HON HAI PRECISION INDUSTRY CO., LTD
9607306 Ambient sampling mass spectrometry and chemometric analysis for screening encapsulated electronic and electrical components for counterfeits Mar 18, 15 Mar 28, 17 , INDIANA UNIVERSITY RESEARCH AND TECHNOLOGY CORPORATION
9607723 Ultra thin radiation window and method for its manufacturing Oct 08, 10 Mar 28, 17 , HS FOILS OY
9607800 High brightness electron impact ion source Mar 16, 16 Mar 28, 17 , NONSEQUITUR TECHNOLOGIES, INC.
9607801 Friction welding of X-ray tube components using intermediate filler materials Sep 19, 14 Mar 28, 17 , GENERAL ELECTRIC COMPANY
9607802 Apparatus and methods for aberration correction in electron beam based system Dec 11, 14 Mar 28, 17 , KLA-TENCOR CORPORATION
9607803 High throughput cooled ion implantation system and method Aug 04, 15 Mar 28, 17 , AXCELIS TECHNOLOGIES INC.
9607804 Scanning transmission electron microscope having multiple beams and post-detection image correction Jun 22, 15 Mar 28, 17 , IBM CORPORATION
9607805 Apparatus of plural charged-particle beams May 10, 16 Mar 28, 17 , HERMES- MICROVISION INC.
9607806 Charged particle multi-beam apparatus including a manipulator device for manipulation of one or more charged particle beams May 30, 12 Mar 28, 17 , MAPPER LITHOGRAPHY IP B.V.

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Recent Publications

Not Available
Publication #TitleFiling DatePub DatePatent Owner
2017/0082,435 Ion Source Alignment Sep 16, 16 Mar 23, 17 , Not available
2017/0082,578 METHOD AND DEVICE FOR SEPARATING METABOLITES OR STEREOISOMERS Dec 01, 16 Mar 23, 17 , Not available
2017/0082,579 METHOD OF ANALYSIS OF COMPONENT IN SAMPLE, METHOD OF SPECIFIC ISOLATION OF COMPONENT IN SAMPLE, AND SAMPLE FOR MASS SPECTROMETRY May 12, 15 Mar 23, 17 , Not available
2017/0082,585 AUTOMATED SYSTEM FOR SAMPLE PREPARATION AND ANALYSIS Nov 29, 16 Mar 23, 17 , Not available
2017/0082,604 SAMPLE DISPENSER INCLUDING AN INTERNAL STANDARD AND METHODS OF USE THEREOF Nov 21, 16 Mar 23, 17 , Not available
2017/0084,416 NANO-PATTERNED SUPERCONDUCTING SURFACE FOR HIGH QUANTUM EFFICIENCY CATHODE Sep 23, 15 Mar 23, 17 , Not available
2017/0084,417 ELECTRON EMITTING DEVICE USING GRAPHENE AND METHOD FOR MANUFACTURING SAME May 13, 14 Mar 23, 17 , Not available
2017/0084,418 3D PRINTED MAGNETRON HAVING ENHANCED COOLING CHARACTERISTICS Sep 21, 16 Mar 23, 17 , Not available
2017/0084,419 GRID, METHOD OF MANUFACTURING THE SAME, AND ION BEAM PROCESSING APPARATUS Dec 01, 16 Mar 23, 17 , Not available
2017/0084,420 ROTARY-ANODE TYPE X-RAY TUBE Dec 05, 16 Mar 23, 17 , TOSHIBA ELECTRON TUBES & DEVICES CO., LTD.
2017/0084,421 Backscattered Electrons (BSE) Imaging Using Multi-Beam Tools Aug 24, 16 Mar 23, 17 , Not available
2017/0084,422 Multi-Beam Dark Field Imaging Aug 24, 16 Mar 23, 17 , Not available
2017/0084,423 Method and System for Noise Mitigation in a Multi-Beam Scanning Electron Microscopy System Sep 16, 16 Mar 23, 17 , Not available
2017/0084,424 Method and System for Focus Adjustment of a Multi-Beam Scanning Electron Microscopy System Sep 21, 16 Mar 23, 17 , Not available
2017/0084,425 SCANNING AN OBJECT USING MULTIPLE MECHANICAL STAGES Dec 07, 16 Mar 23, 17 , APPLIED MATERIALS ISRAEL LTD
2017/0084,426 APPARATUS FOR DETERMINING PROCESS RATE Sep 23, 15 Mar 23, 17 , Not available
2017/0084,427 DIELECTRIC WINDOW, PLASMA PROCESSING SYSTEM INCLUDING THE WINDOW, AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE SYSTEM Jun 10, 16 Mar 23, 17 , SAMSUNG ELECTRONICS CO., LTD.
2017/0084,428 METHOD AND SYSTEM FOR CONTROLLING ION FLUX IN AN RF PLASMA Apr 30, 15 Mar 23, 17 , ECOLE POLYTECHNIQUE
2017/0084,429 Ion Energy Control By RF Pulse Shape Dec 02, 16 Mar 23, 17 , Not available
2017/0084,430 PLASMA ETCHING METHOD Dec 06, 16 Mar 23, 17 , Not available

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Patents Issued To Date - By Filing Year

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