Description
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; arc lamps with consumable electrodes H05B; particle accelerators H05H)
H01J
Technology
back to Watch Results Back to search resultsStats
- 268 21739 Total Patents
- 3184 Total Applications
- 8068 Total Patent Owners
- 68069 TOTAL INVENTORS
Recent Patents
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 8,784,149 | Apparatus and method for repair of defects in an electronic energy control or display device | Apr 05, 13 | Jul 22, 14 | SAGE ELECTROCHROMICS INC. |
| 8,784,150 | Light emitting display and method of manufacturing the same | Dec 10, 12 | Jul 22, 14 | SAMSUNG DISPLAY CO., LTD. |
| 8,784,151 | Variable emissivity material | Jul 21, 11 | Jul 22, 14 | HRL LABORATORIES, LLC |
| 8,785,771 | Zonal utility control system | Jan 26, 12 | Jul 22, 14 | Not available |
| 8,785,835 | Three-dimensional filter enables adaptive focus sensing | Jan 10, 13 | Jul 22, 14 | Not available |
| 8,785,839 | Optical sensor and method of manufacturing the optical sensor | Mar 29, 12 | Jul 22, 14 | SEIKO INSTRUMENTS INC. |
| 8,785,842 | Ion mobility spectrometer including spaced electrodes for filtering | Oct 24, 12 | Jul 22, 14 | SMITHS DETECTION-WATFORD LTD. |
| 8,785,843 | Mass spectrometer sampling cone with coating | Jun 20, 13 | Jul 22, 14 | MICROMASS UK LIMITED |
| 8,785,844 | Method and a mass spectrometer and uses thereof for detecting ions or subsequently-ionised neutral particles from samples | Jul 28, 11 | Jul 22, 14 | ION-TOF TECHNOLOGIES GMBH |
| 8,785,845 | Method and system for operating a time of flight mass spectrometer detection system | Jan 31, 11 | Jul 22, 14 | DH TECHNOLOGIES DEVELOPMENT PTE. LTD. |
| 8,785,846 | Systems and methods for analyzing a sample | Oct 21, 13 | Jul 22, 14 | PURDUE RESEARCH FOUNDATION |
| 8,785,847 | Mass spectrometer having an ion guide with an axial field | Feb 15, 12 | Jul 22, 14 | THERMO FINNIGAN LLC |
| 8,785,848 | Parallel ion mass and ion mobility analysis | Mar 09, 13 | Jul 22, 14 | EXCELLIMS CORPORATION |
| 8,785,850 | Charging of a hole-free thin film phase plate | Jan 15, 11 | Jul 22, 14 | NATIONAL RESEARCH COUNSEL OF CANADA; JEOL LTD.; |
| 8,785,851 | Interference electron microscope | May 23, 13 | Jul 22, 14 | HITACHI, LTD.; RIKEN; |
| 8,785,878 | Charged particle beam apparatus | Nov 19, 12 | Jul 22, 14 | CANON KABUSHIKI KAISHA |
| 8,785,879 | Electron beam wafer inspection system and method of operation thereof | Jul 18, 13 | Jul 22, 14 | ICT INTEGRATED CIRCUIT TESTING GESELLSCHAFT FÜR HALBLEITERPRÜFTECHNIK MBH |
| 8,785,880 | Chromatic aberration corrector and electron microscope | Dec 11, 13 | Jul 22, 14 | JEOL LTD. |
| 8,785,881 | Method and apparatus for a porous electrospray emitter | Nov 01, 13 | Jul 22, 14 | MASSACHUSETTS INSTITUTE OF TECHNOLOGY |
| 8,785,883 | Transmission electron microscope, and method of observing specimen | Apr 27, 09 | Jul 22, 14 | HITACHI HIGH-TECHNOLOGIES CORPORATION |
Recent Publications
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2014/0196,520 | MICRO DISCHARGE DEVICES, METHODS, AND SYSTEMS | Jan 17, 13 | Jul 17, 14 | HONEYWELL INTERNATIONAL INC. |
| 2014/0197,725 | ELECTRIC FIELD DISCHARGE-TYPE ELECTRON SOURCE | Sep 24, 12 | Jul 17, 14 | Not available |
| 2014/0197,726 | METHOD FOR IMPROVING THE WETTABILITY OF A ROTATING ELECTRODE IN A GAS DISCHARGE LAMP | Jan 09, 14 | Jul 17, 14 | Not available |
| 2014/0197,728 | PLASMA DISPLAY PANEL | Jan 16, 13 | Jul 17, 14 | PANASONIC CORPORATION |
| 2014/0197,729 | PLASMA LIGHT SOURCE | Jun 28, 12 | Jul 17, 14 | Not available |
| 2014/0197,733 | APPARATUS AND METHOD FOR MULTIPLEXED MULTIPLE DISCHARGE PLASMA PRODUCED SOURCES | Jan 13, 14 | Jul 17, 14 | KLA-TENCOR CORPORATION |
| 2014/0197,734 | SPIN ROTATION DEVICE | Jun 04, 12 | Jul 17, 14 | SANYU DENSHI CO. LTD. |
| 2014/0197,736 | FILAMENT DETECTION CIRCUIT | Jan 15, 13 | Jul 17, 14 | OSRAM SYLVANIA INC. |
| 2014/0197,761 | FACILITY FOR MICROWAVE TREATMENT OF A LOAD | Apr 25, 12 | Jul 17, 14 | SAIREM SOCIETE POUR L'APPLICATION INDUSTRIELLE DE LA RECHERCHE EN ELECTRONIQUE ET MICRO ONDES |
| 2014/0199,756 | PHYSICAL MEANS AND METHODS FOR INDUCING REGENERATIVE EFFECTS ON LIVING TISSUES AND FLUIDS | May 01, 13 | Jul 17, 14 | ORTERON (T.O) LTD |
| 2014/0199,792 | DEFECT PATTERN EVALUATION METHOD, DEFECT PATTERN EVALUATION APPARATUS, AND RECORDING MEDIA | Mar 14, 13 | Jul 17, 14 | KABUSHIKI KAISHA TOSHIBA |
| 2014/0200,579 | Directional Mesh and Associated Systems | Jan 14, 14 | Jul 17, 14 | ACCELLENT INC. |
| 2014/0200,825 | Method for predicting whether a cancer patient will not benefit from platinum-based chemotherapy agents | Mar 14, 14 | Jul 17, 14 | Not available |
| 2014/0197,026 | SPUTTERING APPARATUS AND METHOD FOR FORMING A TRANSMISSIVE CONDUCTIVE LAYER OF A LIGHT EMITTING DEVICE | Aug 17, 11 | Jul 17, 14 | SAMSUNG ELECTRONICS CO. LTD. |
| 2014/0197,134 | SYSTEMS AND METHODS FOR PLASMA PROCESSING OF MICROFEATURE WORKPIECES | Mar 18, 14 | Jul 17, 14 | MICRON TECHNOLOGY INC. |
| 2014/0197,135 | PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS | Jan 14, 14 | Jul 17, 14 | Not available |
| 2014/0197,136 | High Efficiency Plasma Source | Jul 30, 12 | Jul 17, 14 | Not available |
| 2014/0197,308 | Function Switching With Fast Asynchronous Acquisition | Apr 20, 12 | Jul 17, 14 | MICROMASS UK LIMITED |
| 2014/0197,309 | SYSTEMS AND METHODS OF DETECTING AND DEMONSTRATING HAIR DAMAGE VIA EVALUATION OF PROTEIN FRAGMENTS | Mar 18, 14 | Jul 17, 14 | THE PROCTER & GAMBLE COMPANY |
| 2014/0197,310 | METHOD OF ANALYZING A SAMPLE AND CHARGED PARTICLE BEAM DEVICE FOR ANALYZING A SAMPLE | Jan 08, 14 | Jul 17, 14 | Not available |
