H01J

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ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; arc lamps with consumable electrodes H05B; particle accelerators H05H)

Recent Patents

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Patent #TitleFiling DateIssue DatePatent Owner
8,662,680 Projector with super luminescent diode Jan 30, 13 Mar 04, 14 , SEIKO EPSON CORPORATION
8,662,951 Method for making field emission electron source array Dec 18, 12 Mar 04, 14 , TSINGHUA UNIVERSITY; HON HAI PRECISION INDUSTRY CO., LTD;
8,663,498 Phosphor, method of producing the same, and light emitting apparatus Nov 21, 07 Mar 04, 14 , SHARP KABUSHIKI KAISHA
8,664,000 Analyte ionization by charge exchange for sample analysis under ambient conditions Aug 30, 12 Mar 04, 14 , THE TRUSTEES OF THE STEVENS INSTITUTE OF TECHNOLOGY
8,664,580 Optical sensor and electronic equipment Feb 22, 12 Mar 04, 14 , SHARP KABUSHIKI KAISHA
8,664,582 Display with an optical sensor Oct 12, 09 Mar 04, 14 , HEWLETT-PACKARD COMPANY
8,664,584 Compact tap monitor with a reflection mask Oct 15, 10 Mar 04, 14 , JDS UNIPHASE CORPORATION
8,664,588 Mass spectrometer Feb 08, 12 Mar 04, 14 , HITACHI HIGH-TECHNOLOGIES CORPORATION
8,664,590 Method of processing image charge/current signals Mar 15, 13 Mar 04, 14 , SHIMADZU CORPORATION
8,664,591 Adjusting energy of ions ejected from ion trap Mar 15, 13 Mar 04, 14 , AGILENT TECHNOLOGIES, INC.
8,664,592 Time-of-flight mass spectrometer Sep 06, 11 Mar 04, 14 , SHIMADZU CORPORATION
8,664,593 Control of gas flow in high field asymmetric waveform ion mobility spectrometry Mar 06, 13 Mar 04, 14 , THERMO FINNIGAN LLC
8,664,596 Method for characterizing identified defects during charged particle beam inspection and application thereof Jun 23, 09 Mar 04, 14 , HERMES- MICROVISION INC.
8,664,598 Electron microscope and specimen analyzing method Jan 28, 11 Mar 04, 14 , SII NANOTECHNOLOGY INC.
8,664,619 Hybrid electrostatic lens for improved beam transmission Mar 13, 13 Mar 04, 14 , VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.
8,664,621 Device for generating an ion beam with magnetic filter Sep 14, 09 Mar 04, 14 , CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (C.N.R.S.)
8,664,622 System and method of ion beam source for semiconductor ion implantation Apr 11, 12 Mar 04, 14 , TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD.
8,664,838 Illumination apparatus and a method of assembling the illumination apparatus Dec 08, 11 Mar 04, 14 , KONINKLIJKE PHILIPS N.V.
8,664,839 Electrode cover assembly Aug 01, 12 Mar 04, 14 , Not available
8,664,840 LED bulb capable of mating with light bulb sockets having different configurations Dec 21, 12 Mar 04, 14 , ADVANCED OPTOELECTRONIC TECHNOLOGY, INC.

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Recent Publications

Not Available
Publication #TitleFiling DatePub DatePatent Owner
2014/0061,156 WIDE DYNAMIC RANGE ION ENERGY BIAS CONTROL; FAST ION ENERGY SWITCHING; ION ENERGY CONTROL AND A PULSED BIAS SUPPLY; AND A VIRTUAL FRONT PANEL Aug 27, 13 Mar 06, 14 , ADVANCED ENERGY INDUSTRIES, INC.
2014/0061,157 PLASMA SOURCE WITH INTEGRAL BLADE AND METHOD FOR REMOVING MATERIALS FROM SUBSTRATES Nov 06, 13 Mar 06, 14 , AP SOLUTIONS, INC.
2014/0061,159 COMPOSITE CHARGED PARTICLE BEAM APPARATUS AND THIN SAMPLE PROCESSING METHOD Aug 28, 13 Mar 06, 14 , HITACHI HIGH-TECH SCIENCE CORPORATION
2014/0061,455 IMAGE QUALITY ADJUSTING METHOD, NON-TRANSITORY COMPUTER-READABLE RECORDING MEDIUM, AND ELECTRON MICROSCOPE Feb 11, 13 Mar 06, 14 , KABUSHIKI KAISHA TOSHIBA
2014/0061,456 COORDINATE CORRECTING METHOD, DEFECT IMAGE ACQUIRING METHOD AND ELECTRON MICROSCOPE Feb 28, 13 Mar 06, 14 , KABUSHIKI KAISHA TOSHIBA
2014/0061,457 DEVICE FOR MANIPULATING CHARGED PARTICLES May 04, 12 Mar 06, 14 , SHIMADZU RESEARCH LABORATORY (EUROPE) LTD.
2014/0061,458 EXCITATION OF IONS IN AN ICR-CELL WITH STRUCTURED TRAPPING ELECTRODES Jan 07, 08 Mar 06, 14 , BRUKER DALTONIK GMBH
2014/0061,460 Method and Apparatus for Mass Analysis May 18, 12 Mar 06, 14 , THERMO FISHER SCIENTIFIC (BREMEN) GMBH
2014/0061,461 DEFECT INSPECTION APPARATUS, DEFECT INSPECTION METHOD AND NON-TRANSITORY COMPUTER READABLE RECORDING MEDIUM Dec 13, 12 Mar 06, 14 , Not available
2014/0061,463 IMAGING A SAMPLE IN A TEM EQUIPPED WITH A PHASE PLATE Aug 30, 13 Mar 06, 14 , MAX-PLANCK-GESELLSCHAFT ZUR GORDERUNG DER WISSENSCHAFTEN E.V.; FEI COMPANY;
2014/0061,464 Method of Investigating and Correcting Aberrations in a Charged-Particle Lens System Sep 03, 13 Mar 06, 14 , FEI COMPANY
2014/0061,465 ELECTRON BEAM DETECTOR, ELECTRON BEAM PROCESSING APPARATUS, AND METHOD OF MANUFACTURING ELECTRON BEAM DETECTOR Aug 15, 13 Mar 06, 14 , ADVANTEST CORPORATION
2014/0061,497 CHARGED PARTICLE LITHOGRAPHY SYSTEM WITH INTERMEDIATE CHAMBER Oct 24, 13 Mar 06, 14 , MAPPER LITHOGRAPHY IP B.V.
2014/0061,499 CHARGED PARTICLE BEAM PATTERN WRITING METHOD AND CHARGED PARTICLE BEAM WRITING APPARATUS Jul 25, 13 Mar 06, 14 , NUFLARE TECHNOLOGY, INC.
2014/0061,500 ATMOSPHERIC PRESSURE ION SOURCE WITH EXHAUST SYSTEM Sep 03, 12 Mar 06, 14 , BRUKER DALTONICS INC.
2014/0061,501 SILICON-CONTAINING DOPANT COMPOSITIONS, SYSTEMS AND METHODS OF USE THEREOF FOR IMPROVING ION BEAM CURRENT AND PERFORMANCE DURING SILICON ION IMPLANTATION Aug 28, 13 Mar 06, 14 , Not available
2014/0061,502 SPECIMEN HOLDER FOR HOLDING A SEMICONDUCTOR DEVICE DURING A SAMPLE PREPARATION PROCEDURE CARRIED OUT USING FIRST AND SECOND SAMPLE PREPARATION APPARATUSES Aug 28, 12 Mar 06, 14 , SMI STMICROELECTRONICS S.R.L
2014/0062,286 ION GENERATION METHOD AND ION SOURCE Aug 27, 13 Mar 06, 14 , SEN CORPORATION
2014/0062,295 SEALING COMPOUND AND CERAMIC DISCHARGE VESSEL COMPRISING SUCH SEALING COMPOUND Apr 27, 12 Mar 06, 14 , KONINKLIJKE PHILIPS N.V.
2014/0062,298 MULTIPLE PULSE WIDTH MODULATION WAVEFORMS FOR PLASMA LAMP Aug 31, 12 Mar 06, 14 , TOPANGA TECHNOLOGIES, INC.

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