H01J

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Description

ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; arc lamps with consumable electrodes H05B; particle accelerators H05H)

Subclasses

Not Available
Subclass Title
1/00 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00)
1/02 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00) Main electrodes
1/04 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00) Main electrodes Liquid electrodes, e.g. liquid cathode
1/05 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00) Main electrodes Liquid electrodes, e.g. liquid cathode characterised by material
1/06 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00) Main electrodes Liquid electrodes, e.g. liquid cathode Containers for liquid-pool electrodes; Arrangement or mounting thereof

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Recent Patents

Not Available
Patent #TitleFiling DateIssue DatePatent Owner
9732004 Oxide sintered body, sputtering target, and oxide semiconductor thin film obtained using sputtering target Apr 15, 15 Aug 15, 17 , Sumitomo Metal Mining Co. Ltd.
9732419 Apparatus for forming gas blocking layer and method thereof Feb 15, 13 Aug 15, 17 , Korea University Research and Business Foundation
9732909 Gas supply method Jul 24, 14 Aug 15, 17 , Tokyo Electron Limited
9733124 Microplate reader with linear variable filter Apr 11, 14 Aug 15, 17 , BMG LABTECH, GmbH
9733164 Lamella creation method and device using fixed-angle beam and rotating sample stage Jun 11, 12 Aug 15, 17 , FEI Company
9733184 Visual detection of mercury ions Aug 10, 12 Aug 15, 17 , Indian Institute of Technology Madras
9733198 Method and apparatus for improved sampling resolution in X-ray imaging systems Dec 21, 15 Aug 15, 17 , Novaray Medical, Inc.
9733214 Rapid LC mapping of CoV values for SelexION™ technology using MRM-triggered MRM functionality Feb 10, 15 Aug 15, 17 , DH Technologies Development Pte. Ltd.
9733215 Contamination filter for mass spectrometer Dec 14, 16 Aug 15, 17 , DH Technologies Development Pte. Ltd.
9733228 Methods of analyzing crude oil Jan 23, 14 Aug 15, 17 , Purdue Research Foundation
9733234 Probe for extraction of molecules of interest from a sample Jun 12, 15 Aug 15, 17 , JP SCIENTIFIC LIMITED
9733366 System and method for characterizing focused charged beams Apr 16, 13 Aug 15, 17 , Indian Institute of Technology Kanpur
9734976 Array of carbon nanotube micro-tip structures Jul 20, 16 Aug 15, 17 , Tsinghua University; Hon Hai Precision Industry Co., Ltd;
9734977 Image intensifier with indexed compliant anode assembly Jul 16, 15 Aug 15, 17 , INTEVAC, INC.
9734978 Manufacturing process Jan 08, 13 Aug 15, 17 , Imaging Systems Technology Inc.
9734979 X-ray apparatus and a CT device having the same Sep 18, 14 Aug 15, 17 , Nuctech Company Limited; Tsinghua University;
9734980 Graphene serving as cathode of X-ray tube and X-ray tube thereof Feb 13, 14 Aug 15, 17 , CHONGQING QIYUEYONGYANG MICROELECTRONIC SCIENCE & TECHNOLOGY DEVELOPMENT CO., LTD.
9734981 Charged particle beam writing apparatus and charged particle beam writing method Apr 01, 16 Aug 15, 17 , NuFlare Technology, Inc.
9734982 Beam current density distribution adjustment device and ion implanter May 24, 16 Aug 15, 17 , Nissin Ion Equipment Co. Ltd.
9734984 Multi-beam current quantity measuring method, multi-charged particle drawing control device, and multi-charged particle beam drawing device Jan 20, 16 Aug 15, 17 , NuFlare Technology, Inc.

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Recent Publications

Not Available
Publication #TitleFiling DatePub DatePatent Owner
2017/0231,582 X-RAY PANORAMIC IMAGING APPARATUS Oct 13, 15 Aug 17, 17 , Vatech Co. Ltd.; Vatech Ewoo Holdings, Co., Ltd.;
2017/0232,483 Contamination Removal Apparatus and Method Mar 08, 17 Aug 17, 17 , Not available
2017/0233,532 THIN FILM SELF ASSEMBLY OF TOPCOAT-FREE SILICON-CONTAINING DIBLOCK COPOLYMERS Feb 11, 16 Aug 17, 17 , Not available
2017/0233,863 Ag ALLOY SPUTTERING TARGET, METHOD OF MANUFACTURING Ag ALLOY SPUTTERING TARGET, Ag ALLOY FILM, AND METHOD OF FORMING Ag ALLOY FILM Sep 15, 15 Aug 17, 17 , Not available
2017/0234,841 OPEN PORT SAMPLING INTERFACE Mar 30, 17 Aug 17, 17 , Not available
2017/0234,885 METHODS FOR ASSESSING BIOSPECIMEN INTEGRITY Mar 27, 17 Aug 17, 17 , Not available
2017/0235,227 ELECTRON BEAM RESIST COMPOSITION Jul 30, 15 Aug 17, 17 , The University of Manchester
2017/0236,677 X-RAY SOURCE AND SYSTEM COMPRISING AN X-RAY SOURCE Aug 31, 15 Aug 17, 17 , Not available
2017/0236,678 X-RAY GENERATOR AND X-RAY ANALYZER Aug 18, 15 Aug 17, 17 , Rigaku Corporation
2017/0236,679 X-RAY GENERATOR AND X-RAY ANALYZER Aug 18, 15 Aug 17, 17 , Rigaku Corporation
2017/0236,680 Charged Particle Beam System Nov 02, 16 Aug 17, 17 , Not available
2017/0236,681 Method of Aberration Correction and Charged Particle Beam System Dec 21, 16 Aug 17, 17 , Not available
2017/0236,682 SYSTEM AND METHOD FOR HIGH POWER PULSE GENERATOR Feb 08, 17 Aug 17, 17 , Stangenes Industries Inc.
2017/0236,683 PARTICLE BEAM APPARATUS AND METHOD FOR OPERATING A PARTICLE BEAM APPARATUS Jun 13, 16 Aug 17, 17 , Not available
2017/0236,684 Electron Microscope and Method of Aberration Measurement Feb 02, 17 Aug 17, 17 , Not available
2017/0236,685 MICROREACTOR FOR USE IN MICROSCOPY Apr 28, 17 Aug 17, 17 , Not available
2017/0236,686 ION BEAM IRRADIATION APPARATUS May 03, 17 Aug 17, 17 , NISSIN ION EQUIPMENT CO., LTD.
2017/0236,687 CROSS SECTIONAL DEPTH COMPOSITION GENERATION UTILIZING SCANNING ELECTRON MICROSCOPY Apr 28, 17 Aug 17, 17 , Not available
2017/0236,688 CHAMBER MEMEBER OF A PLASMA SOURCE AND PEDESTAL WITH RADIALLY OUTWARD POSITIONED LIFT PINS FOR TRANSLATION OF A SUBSTRATE C-RING Feb 09, 17 Aug 17, 17 , Not available
2017/0236,689 PARTICLE GENERATION SUPPRESOR BY DC BIAS MODULATION May 04, 17 Aug 17, 17 , Not available

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Patents Issued To Date - By Filing Year

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