H01J

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Description

ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; arc lamps with consumable electrodes H05B; particle accelerators H05H)

Subclasses

Not Available
Subclass Title
1/00 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00)
1/02 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00) Main electrodes
1/04 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00) Main electrodes Liquid electrodes, e.g. liquid cathode
1/05 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00) Main electrodes Liquid electrodes, e.g. liquid cathode characterised by material
1/06 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00) Main electrodes Liquid electrodes, e.g. liquid cathode Containers for liquid-pool electrodes; Arrangement or mounting thereof

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Recent Patents

Not Available
Patent #TitleFiling DateIssue DatePatent Owner
9,340,866 Substrate support with radio frequency (RF) return path Mar 30, 12 May 17, 16 APPLIED MATERIALS, INC., APPLIED MATERIALS, INC.
9,340,868 Sputtering device Feb 06, 13 May 17, 16 SAMSUNG DISPLAY CO., LTD., SAMSUNG DISPLAY CO., LTD.
9,340,870 Magnetic field fluctuation for beam smoothing Feb 15, 13 May 17, 16 ADVANCED ION BEAM TECHNOLOGY, INC., ADVANCED ION BEAM TECHNOLOGY, INC.
9,340,877 Method and system for modifying photoresist using electromagnetic radiation and ion implantation May 07, 13 May 17, 16 VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC., VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.
9,340,931 Method and system for in-situ cross linking of polymers, bitumen and similar materials to increase strength, toughness and durability via irradiation with electron beams from mobile accelerators Nov 16, 15 May 17, 16 FERMI RESEARCH ALLIANCE, LLC, FERMI RESEARCH ALLIANCE, LLC
9,341,584 Charged-particle microscope device and method for inspecting sample using same Jun 18, 10 May 17, 16 HITACHI HIGH-TECHNOLOGIES CORPORATION, HITACHI HIGH -TECHNOLOGIES CORPORATION
9,341,585 X-ray detector including integrated electron detector Oct 15, 13 May 17, 16 PULSETOR, LLC, PULSETOR, LLC
9,341,610 Electrical arc trigger systems, methods, and apparatuses Aug 29, 13 May 17, 16 THE BOEING COMPANY, THE BOEING COMPANY
9,341,752 Viewport protector for an extreme ultraviolet light source Nov 07, 12 May 17, 16 ASML NETHERLANDS B.V., ASML NETHERLANDS B.V.
9,341,936 Method and system for forming a pattern on a reticle using charged particle beam lithography Feb 11, 14 May 17, 16 D2S, INC., D2S, INC.
9,342,715 Marking paper products Jun 18, 14 May 17, 16 XYLECO, INC., XYLECO, INC.
9,342,878 Charged particle beam apparatus Oct 24, 11 May 17, 16 HITACHI HIGH-TECHNOLOGIES CORPORATION, HITACHI HIGH-TECHNOLOGIES CORPORATION
9,343,259 GCIB nozzle assembly Jul 31, 15 May 17, 16 TEL EPION INC., TEL EPION INC.
9,343,260 Multipole and charged particle radiation apparatus using the same Feb 29, 12 May 17, 16 HITACHI HIGH-TECHNOLOGIES CORPORATION, HITACHI HIGH -TECHNOLOGIES CORPORATION
9,343,261 Desktop electron microscope and combined round-multipole magnetic lens thereof Nov 06, 14 May 17, 16 NATIONAL TSING HUA UNIVERSITY, NATIONAL TSING HUA UNIVERSITY
9,343,262 Ion implantation apparatus, beam parallelizing apparatus, and ion implantation method Aug 26, 14 May 17, 16 SUMITOMO HEAVY INDUSTRIES ION TECHNOLOGY CO., LTD., SUMITOMO HEAVY INDUSTRIES ION TECHNOLOGY CO., LTD.
9,343,263 Ion implanter, beam energy measuring device, and method of measuring beam energy Mar 12, 15 May 17, 16 SUMITOMO HEAVY INDUSTRIES ION TECHNOLOGY CO., LTD., SUMITOMO HEAVY INDUSTRIES ION TECHNOLOGY CO., LTD.
9,343,264 Scanning electron microscope device and pattern dimension measuring method using same Jul 01, 10 May 17, 16 HITACHI HIGH-TECHNOLOGIES CORPORATION, HITACHI HIGH -TECHNOLOGIES CORPORATION
9,343,265 Charged particle beam irradiation apparatus Dec 25, 12 May 17, 16 HITACHI HIGH-TECHNOLOGIES CORPORATION, HITACHI HIGH-TECHNOLOGIES CORPORATION
9,343,266 Charged particle beam pattern writing method and charged particle beam writing apparatus that corrects beam rotation utilizing a correlation table Jul 25, 13 May 17, 16 NUFLARE TECHNOLOGY, INC., NUFLARE TECHNOLOGY, INC.

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Recent Publications

Not Available
Publication #TitleFiling DatePub DatePatent Owner
2016/0137,529 Plasma Spark Discharge Reactor and Durable Electrode Nov 04, 15 May 19, 16 DREXEL UNIVERSITY,
2016/0137,799 Formation of Superhydrophobic Surfaces Jun 13, 14 May 19, 16 ,
2016/0138,161 RADICAL ASSISTED CURE OF DIELECTRIC FILMS Jul 31, 15 May 19, 16 APPLIED MATERIALS, INC.,
2016/0138,162 SUBSTRATE PROCESSING APPARATUS Nov 03, 15 May 19, 16 TOKYO ELECTRON LIMITED,
2016/0138,171 METHOD FOR MANUFACTURING CORROSION RESISTANT AND CONDUCTIVE NANO CARBON COATING LAYER AND FUEL CELL BIPOLAR PLATE THEREBY USING STAINLESS STEEL SUBSTRATE Oct 16, 15 May 19, 16 J&L TECH CO., LTD.,
2016/0139,302 Formation of Antireflective Surfaces Jun 13, 14 May 19, 16 BROOKHAVEN SCIENCE ASSOCIATES, LLC,
2016/0139,398 Specimen Holder, Specimen Preparation Device, and Positioning Method Nov 18, 15 May 19, 16 JEOL LTD.,
2016/0139,511 METHOD FOR MAKING NANO-PILLAR ARRAY ON SUBSTRATE Aug 21, 15 May 19, 16 TSINGHUA UNIVERSITY,
2016/0141,142 BLANKING SYSTEM FOR MULTI CHARGED PARTICLE BEAMS, AND MULTI CHARGED PARTICLE BEAM WRITING APPARATUS Oct 09, 15 May 19, 16 NUFLARE TECHNOLOGY, INC.,
2016/0141,143 ELECTRON BEAM WRITING APPARATUS AND OUTPUT CONTROL METHOD Nov 10, 15 May 19, 16 NUFLARE TECHNOLOGY, INC.,
2016/0141,144 Method and Apparatus for Electron Beam Lithography Jan 25, 16 May 19, 16 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.,
2016/0141,145 Micro Machined Two Dimensional Faraday Collector Grid Nov 18, 14 May 19, 16 HAMILTON SUNDSTRAND CORPORATION,
2016/0141,146 CERTIFIED WAFER INSPECTION Nov 18, 14 May 19, 16 EXNODES INC.,
2016/0141,147 AUTOMATED TEM SAMPLE PREPARATION Nov 06, 15 May 19, 16 FEI COMPANY,
2016/0141,148 PLASMA PROCESS APPARATUS HAVING VIEW PORT Jul 02, 15 May 19, 16 SAMSUNG ELECTRONICS CO., LTD.,
2016/0141,149 METHOD OF MAKING A NANOSTRUCTURE AND NANOSTRUCTURED ARTICLES Jul 23, 14 May 19, 16 3M INNOVATIVE PROPERTIES COMPANY,
2016/0141,150 FAST-GAS SWITCHING FOR ETCHING Jan 22, 16 May 19, 16 ,
2016/0141,151 PLASMA PROCESSING APPARATUS Sep 05, 15 May 19, 16 HITACHI HIGH-TECHNOLOGIES CORPORATION,
2016/0141,152 METHOD AND SYSTEM FOR MODIFYING A SUBSTRATE USING A PLASMA Jul 03, 14 May 19, 16 INNOVATION ULSTER LIMITED,
2016/0141,153 DUAL PHASE CLEANING CHAMBERS AND ASSEMBLIES COMPRISING THE SAME Jan 21, 16 May 19, 16 LAM RESEARCH CORPORATION,

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Patents Issued To Date - By Filing Year

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