H01J

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Description

ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; arc lamps with consumable electrodes H05B; particle accelerators H05H)

Subclasses

Not Available
Subclass Title
1/00 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00)
1/02 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00) Main electrodes
1/04 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00) Main electrodes Liquid electrodes, e.g. liquid cathode
1/05 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00) Main electrodes Liquid electrodes, e.g. liquid cathode characterised by material
1/06 Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps (details of electron-optical arrangements or of ion traps H01J 3/00) Main electrodes Liquid electrodes, e.g. liquid cathode Containers for liquid-pool electrodes; Arrangement or mounting thereof

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Recent Patents

Not Available

Recent Publications

Not Available
Publication #TitleFiling DatePub DatePatent Owner
2019/0276,936 CONDENSATION SUPPRESSING METHOD AND PROCESSING SYSTEM Mar 07, 19 Sep 12, 19 , Not available
2019/0279,839 VACUUM CONNECTION MECHANISM AND ELECTRON OPTICAL DEVICE Feb 27, 19 Sep 12, 19 , Not available
2019/0279,848 MEASURING DEVICE AND OPERATION METHOD OF SYSTEM FOR INSPECTING FOCUS RING Mar 08, 19 Sep 12, 19 , Tokyo Electron Limited
2019/0279,836 X-RAY TUBE Mar 06, 19 Sep 12, 19 , Canon Electron Tubes & Devices Co., Ltd.
2019/0279,850 PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS Mar 06, 19 Sep 12, 19 , Not available
2019/0279,843 APPARATUS, METHOD, AND PROGRAM FOR PROCESSING AND OBSERVING CROSS SECTION, AND METHOD OF MEASURING SHAPE Mar 06, 19 Sep 12, 19 , Not available
2019/0279,834 High-Frequency Vacuum Electronic Device Mar 12, 18 Sep 12, 19 , Not available
2019/0279,838 Charged Particle Beam Apparatus and Sample Observation Method Nov 22, 16 Sep 12, 19 , Not available
2019/0279,853 MATRIX-ASSISTED LASER DESORPTION/IONIZATION MASS SPECTROMETRY METHOD Oct 30, 17 Sep 12, 19 , Not available
2019/0275,565 METHOD OF SELECTIVELY REMOVING A CONTAMINANT FROM AN OPTICAL COMPONENT Mar 06, 18 Sep 12, 19 , GM Global Technology Operations LLC
2019/0276,368 COMPOSITE STRUCTURE, SEMICONDUCTOR MANUFACTURING APPARATUS AND DISPLAY MANUFACTURING APPARATUS PROVIDED WITH COMPOSITE STRUCTURE Mar 08, 19 Sep 12, 19 , Not available
2019/0279,845 ANTENNA DEVICE AND PLASMA PROCESSING APPARATUS Mar 11, 19 Sep 12, 19 , Tokyo Electron Limited
2019/0280,042 MONOLITHIC SILICON PIXEL DETECTOR, AND SYSTEMS AND METHODS FOR PARTICLE DETECTION May 11, 17 Sep 12, 19 , G-ray Industries SA
2019/0277,735 SYSTEMS AND METHODS FOR ANALYZING AN ANALYTE EXTRACTED FROM A SAMPLE USING AN ADSORBENT MATERIAL Jun 02, 17 Sep 12, 19 , Not available
2019/0279,894 WORKPIECE PLACEMENT APPARATUS AND PROCESSING APPARATUS Mar 06, 19 Sep 12, 19 , Not available
2019/0276,366 Y2O3-ZrO2 EROSION RESISTANT MATERIAL FOR CHAMBER COMPONENTS IN PLASMA ENVIRONMENTS Feb 19, 19 Sep 12, 19 , Not available
2019/0279,842 APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS Mar 18, 19 Sep 12, 19 , Not available
2019/0279,855 SAMPLE ANALYZER AND SAMPLE ANALYSIS METHOD Aug 27, 18 Sep 12, 19 , TOSHIBA MEMORY CORPORATION
2019/0279,846 PLASMA PROCESSING SYSTEM, ELECTRON BEAM GENERATOR, AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE May 23, 19 Sep 12, 19 , Not available
2019/0279,841 SCAN STRATEGIES TO MINIMIZE CHARGING EFFECTS AND RADIATION DAMAGE OF CHARGED PARTICLE BEAM METROLOGY SYSTEM May 02, 18 Sep 12, 19 , KLA-TENCOR Corporation

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Patents Issued To Date - By Filing Year

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