H01J

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Description

ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; arc lamps with consumable electrodes H05B; particle accelerators H05H)

Recent Patents

Not Available
Patent #TitleFiling DateIssue DatePatent Owner
8,784,149 Apparatus and method for repair of defects in an electronic energy control or display device Apr 05, 13 Jul 22, 14 , SAGE ELECTROCHROMICS INC.
8,784,150 Light emitting display and method of manufacturing the same Dec 10, 12 Jul 22, 14 , SAMSUNG DISPLAY CO., LTD.
8,784,151 Variable emissivity material Jul 21, 11 Jul 22, 14 , HRL LABORATORIES, LLC
8,785,771 Zonal utility control system Jan 26, 12 Jul 22, 14 , Not available
8,785,835 Three-dimensional filter enables adaptive focus sensing Jan 10, 13 Jul 22, 14 , Not available
8,785,839 Optical sensor and method of manufacturing the optical sensor Mar 29, 12 Jul 22, 14 , SEIKO INSTRUMENTS INC.
8,785,842 Ion mobility spectrometer including spaced electrodes for filtering Oct 24, 12 Jul 22, 14 , SMITHS DETECTION-WATFORD LTD.
8,785,843 Mass spectrometer sampling cone with coating Jun 20, 13 Jul 22, 14 , MICROMASS UK LIMITED
8,785,844 Method and a mass spectrometer and uses thereof for detecting ions or subsequently-ionised neutral particles from samples Jul 28, 11 Jul 22, 14 , ION-TOF TECHNOLOGIES GMBH
8,785,845 Method and system for operating a time of flight mass spectrometer detection system Jan 31, 11 Jul 22, 14 , DH TECHNOLOGIES DEVELOPMENT PTE. LTD.
8,785,846 Systems and methods for analyzing a sample Oct 21, 13 Jul 22, 14 , PURDUE RESEARCH FOUNDATION
8,785,847 Mass spectrometer having an ion guide with an axial field Feb 15, 12 Jul 22, 14 , THERMO FINNIGAN LLC
8,785,848 Parallel ion mass and ion mobility analysis Mar 09, 13 Jul 22, 14 , EXCELLIMS CORPORATION
8,785,850 Charging of a hole-free thin film phase plate Jan 15, 11 Jul 22, 14 , NATIONAL RESEARCH COUNSEL OF CANADA; JEOL LTD.;
8,785,851 Interference electron microscope May 23, 13 Jul 22, 14 , HITACHI, LTD.; RIKEN;
8,785,878 Charged particle beam apparatus Nov 19, 12 Jul 22, 14 , CANON KABUSHIKI KAISHA
8,785,879 Electron beam wafer inspection system and method of operation thereof Jul 18, 13 Jul 22, 14 , ICT INTEGRATED CIRCUIT TESTING GESELLSCHAFT FÜR HALBLEITERPRÜFTECHNIK MBH
8,785,880 Chromatic aberration corrector and electron microscope Dec 11, 13 Jul 22, 14 , JEOL LTD.
8,785,881 Method and apparatus for a porous electrospray emitter Nov 01, 13 Jul 22, 14 , MASSACHUSETTS INSTITUTE OF TECHNOLOGY
8,785,883 Transmission electron microscope, and method of observing specimen Apr 27, 09 Jul 22, 14 , HITACHI HIGH-TECHNOLOGIES CORPORATION

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Recent Publications

Not Available
Publication #TitleFiling DatePub DatePatent Owner
2014/0196,520 MICRO DISCHARGE DEVICES, METHODS, AND SYSTEMS Jan 17, 13 Jul 17, 14 , HONEYWELL INTERNATIONAL INC.
2014/0197,725 ELECTRIC FIELD DISCHARGE-TYPE ELECTRON SOURCE Sep 24, 12 Jul 17, 14 , Not available
2014/0197,726 METHOD FOR IMPROVING THE WETTABILITY OF A ROTATING ELECTRODE IN A GAS DISCHARGE LAMP Jan 09, 14 Jul 17, 14 , Not available
2014/0197,728 PLASMA DISPLAY PANEL Jan 16, 13 Jul 17, 14 , PANASONIC CORPORATION
2014/0197,729 PLASMA LIGHT SOURCE Jun 28, 12 Jul 17, 14 , Not available
2014/0197,733 APPARATUS AND METHOD FOR MULTIPLEXED MULTIPLE DISCHARGE PLASMA PRODUCED SOURCES Jan 13, 14 Jul 17, 14 , KLA-TENCOR CORPORATION
2014/0197,734 SPIN ROTATION DEVICE Jun 04, 12 Jul 17, 14 , SANYU DENSHI CO. LTD.
2014/0197,736 FILAMENT DETECTION CIRCUIT Jan 15, 13 Jul 17, 14 , OSRAM SYLVANIA INC.
2014/0197,761 FACILITY FOR MICROWAVE TREATMENT OF A LOAD Apr 25, 12 Jul 17, 14 , SAIREM SOCIETE POUR L'APPLICATION INDUSTRIELLE DE LA RECHERCHE EN ELECTRONIQUE ET MICRO ONDES
2014/0199,756 PHYSICAL MEANS AND METHODS FOR INDUCING REGENERATIVE EFFECTS ON LIVING TISSUES AND FLUIDS May 01, 13 Jul 17, 14 , ORTERON (T.O) LTD
2014/0199,792 DEFECT PATTERN EVALUATION METHOD, DEFECT PATTERN EVALUATION APPARATUS, AND RECORDING MEDIA Mar 14, 13 Jul 17, 14 , KABUSHIKI KAISHA TOSHIBA
2014/0200,579 Directional Mesh and Associated Systems Jan 14, 14 Jul 17, 14 , ACCELLENT INC.
2014/0200,825 Method for predicting whether a cancer patient will not benefit from platinum-based chemotherapy agents Mar 14, 14 Jul 17, 14 , Not available
2014/0197,026 SPUTTERING APPARATUS AND METHOD FOR FORMING A TRANSMISSIVE CONDUCTIVE LAYER OF A LIGHT EMITTING DEVICE Aug 17, 11 Jul 17, 14 , SAMSUNG ELECTRONICS CO. LTD.
2014/0197,134 SYSTEMS AND METHODS FOR PLASMA PROCESSING OF MICROFEATURE WORKPIECES Mar 18, 14 Jul 17, 14 , MICRON TECHNOLOGY INC.
2014/0197,135 PLASMA PROCESSING METHOD AND PLASMA PROCESSING APPARATUS Jan 14, 14 Jul 17, 14 , Not available
2014/0197,136 High Efficiency Plasma Source Jul 30, 12 Jul 17, 14 , Not available
2014/0197,308 Function Switching With Fast Asynchronous Acquisition Apr 20, 12 Jul 17, 14 , MICROMASS UK LIMITED
2014/0197,309 SYSTEMS AND METHODS OF DETECTING AND DEMONSTRATING HAIR DAMAGE VIA EVALUATION OF PROTEIN FRAGMENTS Mar 18, 14 Jul 17, 14 , THE PROCTER & GAMBLE COMPANY
2014/0197,310 METHOD OF ANALYZING A SAMPLE AND CHARGED PARTICLE BEAM DEVICE FOR ANALYZING A SAMPLE Jan 08, 14 Jul 17, 14 , Not available

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