C09G 1/06

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Class  C09G : POLISHING COMPOSITIONS OTHER THAN FRENCH POLISH; SKI WAXES


Subclass 1/06: Polishing compositions (French polish C09F 11/00; detergents C11D) Other polishing compositions

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
11862472 Methods for polishing dielectric layer in forming semiconductor deviceAug 23, 22Jan 02, 24Yangtze Memory Technologies Co., Ltd.
11820919 Ruthenium CMP chemistry based on halogenationFeb 17, 22Nov 21, 23Tokyo Electron Limited
11806836 Calcium carbonate slurryDec 06, 21Nov 07, 23Illumina Inc.
11767448 Polishing liquid, polishing liquid set, and polishing methodMar 20, 19Sep 26, 23Resonac Corporation
11732157 Polishing compositions and methods of use thereofOct 06, 20Aug 22, 23Fujifilm Electronic Materials U.S.A., Inc.
11718767 Chemical mechanical planarization composition for polishing oxide materials and method of use thereofAug 06, 19Aug 08, 23VERSUM MATERIALS US, LLC
11713404 Polishing agent, polishing method, and liquid additive for polishingMay 12, 21Aug 01, 23AGC INC.
11680186 Polishing compositions and methods of using sameNov 06, 20Jun 20, 23Fujifilm Electronic Materials U.S.A., Inc.
11518912 Polishing slurry, method for polishing glass, and method for manufacturing glassMay 19, 21Dec 06, 22AGC INC.
11505718 Barrier ruthenium chemical mechanical polishing slurryMay 12, 21Nov 22, 22FUJIFILM ELECTRONIC MATERIALS U.S.A., INC.
11492514 Derivatized polyamino acidsDec 16, 20Nov 08, 22CMC Materials, Inc.
11462415 Methods for polishing dielectric layer in forming semiconductor deviceJan 29, 21Oct 04, 22Yangtze Memory Technologies Co., Ltd.
11370939 Polishing slurry, method for polishing glass, and method for manufacturing glassAug 28, 20Jun 28, 22AGC INC.
11352523 Polishing liquid, polishing liquid set and polishing methodMar 20, 19Jun 07, 22Showa Denko Materials Co., Ltd.
11292939 Polishing liquid, polishing liquid set and polishing methodMar 20, 19Apr 05, 22Showa Denko Materials Co., Ltd.
11292938 Method of selective chemical mechanical polishing cobalt, zirconium oxide, poly-silicon and silicon dioxide filmsSep 11, 19Apr 05, 22Rohm and Haas Electronic Materials CMP Holdings, Inc.
11286403 Chemical mechanical polishing composition, chemical mechanical polishing slurry and method for polishing substrateJul 17, 19Mar 29, 22DongJin Semichem Co. Ltd.
11267987 Chemical mechanical polishing slurry composition and method of polishing metal layerMar 02, 20Mar 08, 22Taiwan Semiconductor Manufacturing Company Ltd.
11254839 Low oxide trench dishing shallow trench isolation chemical mechanical planarization polishingDec 12, 19Feb 22, 22VERSUM MATERIALS US, LLC
11254871 Etching composition for silicon nitride layer and method of etching silicon nitride layer using the sameOct 15, 20Feb 22, 22Samsung SDI Co., Ltd.

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Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2024/0043,721 Ruthenium CMP Chemistry Based On HalogenationOct 18, 23Feb 08, 24Not available

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