G01J 1/20

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Description

Class  G01J : MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY


Subclass 1/20: Photometry, e.g. photographic exposure meter (spectrophotometry G01J 3/00; specially adapted for radiation pyrometry G01J 5/00) by comparison with reference light or electric value intensity of the measured or reference value being varied to equalise their effects at the detector, e.g. by varying incidence angle

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
12181347 Wavefront sensors with irregular aperture masks, diffusers, and cameras, and methods of making and using the sameDec 14, 21Dec 31, 24Quartus Engineering Incorporated
11802792 Technique for determining presence of a species in a sampleNov 01, 21Oct 31, 233M Innovative Properties Company
11719532 Electronic device and method for reconstructing shape of a deformable object from captured imagesAug 11, 21Aug 08, 23Sony Group Corporation
11474029 SpectrophotometerJul 15, 21Oct 18, 22Shimadzu Corporation
11294098 Solar irradiance intensity estimation apparatus, solar irradiance intensity estimation system, and solar irradiance intensity estimation methodMar 01, 18Apr 05, 22KABUSHIKI KAISHA TOSHIBA
11187576 Optical filters having spatially variant microreplicated layersMay 25, 17Nov 30, 213M Innovative Properties Company
11169241 Sensor and control method thereofJun 06, 19Nov 09, 21SUZHOU JSOLAR INCORPORATED
11128103 Modulated light sourceJan 11, 16Sep 21, 21Fujitsu Limited; Photonics Electronics Technology Research Association (PETRA);
10877266 Digital camera with wireless image transferNov 22, 19Dec 29, 20Optimum Imaging Technologies LLC
10792978 Vehicle sensor assembly for detecting solar radiation and air conditioning system having the sameDec 28, 17Oct 06, 20Hyundai Motor Compnay; Kia Motors Corporation; OMRON AUTOMOTIVE ELECTRONIC KOREA CO., LTD.;
10746594 Thermopile bias method for low voltage infrared readout integrated circuitsAug 05, 19Aug 18, 20United States of America as represented by the Administrator of NASA
10444067 Optical sensing apparatus and measuring method thereofDec 29, 14Oct 15, 19(6) INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
10433493 Controlling ultraviolet intensity over a surface of a light sensitive objectSep 21, 17Oct 08, 19Sensor Electronic Technology, Inc.
10379332 Stereoscopic viewing apparatusNov 05, 15Aug 13, 19Vision Engineering Limited
10346136 Device and method for managing performance of quantum noise-based random number generatorDec 19, 16Jul 09, 19ID QUANTIQUE SA
10324267 Focus adjustment apparatus, control method for focus adjustment apparatus, and storage mediumMay 04, 15Jun 18, 19CANON KABUSHIKI KAISHA
10247811 Modulation of input to Geiger mode avalanche photodiode LIDAR using digital micromirror devicesOct 16, 14Apr 02, 19Harris Corporation
10248943 Object recognition system for checkout lane managementMay 18, 17Apr 02, 19Not available
10085334 Extreme ultraviolet light generating systemMar 06, 18Sep 25, 18Gigaphoton Inc.
9989218 Methods and apparatus for adjusting a lighting parameter in a light management system based on user actionSep 04, 13Jun 05, 18Philips Lighting Holding B.V.

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Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2024/0201,012 CHARACTERISTIC VALUE CORRECTION DEVICE, CHARACTERISTIC VALUE CALCULATION DEVICE, INSPECTION DEVICE INCLUDING THE SAME, CHARACTERISTIC VALUE CORRECTION METHOD, LIGHT-EMITTING DEVICE, AND CHARACTERISTIC VALUE CORRECTION PROGRAMDec 11, 23Jun 20, 24Not available

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