G01J 1/30

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Description

Class  G01J : MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY


Subclass 1/30: Photometry, e.g. photographic exposure meter (spectrophotometry G01J 3/00; specially adapted for radiation pyrometry G01J 5/00) by comparison with reference light or electric value intensity of the measured or reference value being varied to equalise their effects at the detector, e.g. by varying incidence angle using variation of intensity or distance of source (G01J 1/34 takes precedence) using electric radiation detectors

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
11359964 Automated delay line alignmentSep 08, 20Jun 14, 22ULTRAFAST SYSTEMS LLC
10746594 Thermopile bias method for low voltage infrared readout integrated circuitsAug 05, 19Aug 18, 20United States of America as represented by the Administrator of NASA
10728986 Low-voltage alternating current-based LED light with built-in cooling and automatic or manual dimmingMay 02, 17Jul 28, 20Not available
10672344 Display device displaying a plurality of patterns receiving luminance and color coordinates data for said patterns from an external user deviceDec 15, 16Jun 02, 20LG Display Co., Ltd.
10462876 Light emitting diode sensor device including a contoured structureMay 31, 17Oct 29, 19ABB Schweiz AG
10209131 Automated delay line alignmentAug 19, 16Feb 19, 19ULTRAFAST SYSTEMS LLC
10072972 Non-contact methods of measuring insertion loss in optical fiber connectorsJan 24, 17Sep 11, 18Corning Optical Communications LLC
9468368 Optical coupling efficiency detectionAug 26, 14Oct 18, 16NOVARTIS AG
9442005 Non-contact methods of measuring insertion loss in optical fiber connectorsJul 30, 14Sep 13, 16CORNING OPTICAL COMMUNICATIONS LLC
9007579 Device and method for measuring luminescenceApr 04, 09Apr 14, 15CARL ZEISS MICROSCOPY GMBH

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Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2023/0033,014 OPTICAL MEASURING DEVICE, OPTICAL MEASURING METHOD, DATA PROCESSING DEVICE, AND PROGRAMJul 22, 22Feb 02, 23Not available

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