G01Q 10/00

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Class  G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]


Subclass 10/00: Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
10564181 Atomic force microscope with optical guiding mechanismAug 27, 18Feb 18, 20Nanosurf AG
10557865 Quantitative measurements using multiple frequency atomic force microscopyJul 03, 17Feb 11, 20Oxford Instruments Asylum Research, Inc.
10431419 Sparse sampling methods and probe systems for analytical instrumentsJul 07, 17Oct 01, 19Battelle Memorial Institute
10416190 Modular atomic force microscope with environmental controlsFeb 28, 17Sep 17, 19Oxford Instruments Asylum Research, Inc.
10384238 Debris removal in high aspect structuresMay 20, 16Aug 20, 19Rave LLC
10197595 Dual-probe scanning probe microscopeMar 22, 16Feb 05, 19Bruker Nano, Inc.
10119990 Scanning probe microscope and method for examining a surface with a high aspect ratioDec 21, 16Nov 06, 18Carl Zeiss SMT GmbH
10088450 Method for evaluating structural change during production process, and analysis programDec 08, 14Oct 02, 18Hitachi Ltd.
10088498 Stimulating an optical sensor using optical radiation pressureAug 28, 15Oct 02, 18Panorama Synergy Ltd.
10054613 Scanning probe microscope combined with a device for modifying the surface of an objectJul 10, 15Aug 21, 18PRIVATE INSTITUTION “NAZARBAYEV UNIVERSITY RESEARCH AND INNOVATION SYSTEM”
10048289 Motion sensor integrated nano-probe N/MEMS apparatus, method, and applicationsDec 17, 12Aug 14, 18Cornell University
10041970 High speed adaptive-multi-loop mode imaging atomic force microscopyJul 14, 15Aug 07, 18Board of Trustees Rutgers The State University of New Jersey
10024899 Method and apparatus for detecting an energized e-fieldFeb 28, 17Jul 17, 18Whirlpool Corporation
9995764 Method and apparatus for avoiding damage when analysing a sample surface with a scanning probe microscopeMar 10, 17Jun 12, 18Carl Zeiss SMT GmbH
9989556 Systems and devices for non-destructive surface chemical analysis of samplesFeb 09, 17Jun 05, 18Horiba Instruments Incorporated
9977049 Scanning probe microscope and control method thereofApr 06, 16May 22, 18OLYMPUS CORPORATION
9891246 Harmonic feedback atomic force microscopyAug 05, 16Feb 13, 18Not available
9885736 Electrode control methodology for a scanning tunneling microscopeJun 06, 16Feb 06, 18Not available
9766266 Method of advancing a probe tip of a scanning microscopy device towards a sample surface, and device thereforeApr 28, 15Sep 19, 17NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
9709598 Scanning ion conductance microscopy using surface roughness for probe movementMay 27, 16Jul 18, 17IMPERIAL INNOVATIONS LIMITED

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Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2018/0292,439 METHOD AND APPARATUS FOR DETECTING AN ENERGIZED E-FIELDJun 14, 18Oct 11, 18Not available
2016/0266,165 DEBRIS REMOVAL FROM HIGH ASPECT STRUCTURESMay 20, 16Sep 15, 16RAVE LLC

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Patents Issued To Date - By Filing Year

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