G01Q 10/02

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Description

Class  G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]


Subclass 10/02: Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe Coarse scanning or positioning

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
10161958 Three-dimensional fine movement deviceJul 09, 15Dec 25, 18Hitachi High-Tech Science Corporation
10151773 Scanning probe microscope and probe contact detection methodMar 24, 17Dec 11, 18HITACHI HIGH-TECH SCIENCE CORPORATION
9995763 Precise probe placement in automated scanning probe microscopy systemsFeb 24, 15Jun 12, 18Bruker Nano, Inc.
9841436 AM/FM measurements using multiple frequency of atomic force microscopySep 26, 16Dec 12, 17OXFORD INSTRUMENTS ASYLUM RESEARCH, INC
9709598 Scanning ion conductance microscopy using surface roughness for probe movementMay 27, 16Jul 18, 17IMPERIAL INNOVATIONS LIMITED
9506947 System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobingNov 24, 14Nov 29, 16DCG SYSTEMS, INC.
9052340 Probe assembly for a scanning probe microscopeMar 29, 11Jun 09, 15INFINITESIMA LIMITED
8402561 MEMS actuator device with integrated temperature sensorsOct 15, 09Mar 19, 13ADHAWK MICROSYSTEMS INC.
8397311 Metrology probe and method of configuring a metrology probeMay 28, 10Mar 12, 13THE RESEARCH FOUNDATION FOR THE STATE UNIVERSITY OF NEW YORK

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Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2020/0049,733 SCANNER AND SCANNING PROBE MICROSCOPEDec 07, 17Feb 13, 20Osaka University
2018/0348,254 COUPLED MULTISCALE POSITIONING OF ARRAYS OF PARALLEL, INDEPENDENTLY ACTUATED AND SIMULTANEOUSLY DRIVEN MODULAR SCANNING PROBE MICROSCOPES FOR HIGH-THROUGHPUT, IN-LINE, NANOSCALE MEASUREMENT OF FLEXIBLE, LARGE AREA, AND ROLL-TO-ROLL PROCESSESMay 31, 18Dec 06, 18Not available
2018/0074,092 INFORMATION ACQUIRING METHOD IN ATOMIC FORCE MICROSCOPENov 15, 17Mar 15, 18OLYMPUS CORPORATION
2017/0254,834 Modular Atomic Force MicroscopeMar 22, 17Sep 07, 17Not available

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Patents Issued To Date - By Filing Year

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