G01Q 10/04

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Class  G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]


Subclass 10/04: Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe Fine scanning or positioning

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
10564180 Scanning probe microscope using gradual increases and decreases in relative speed when shifting and reciprocating the scanned probe across a sampleApr 14, 15Feb 18, 20Shimadzu Corporation
10533847 Inspection mechanism for metal blankMar 08, 18Jan 14, 20FACTORY AUTOMATION TECHNOLOGY CO., LTD.
10527645 Compact probe for atomic-force microscopy and atomic-force microscope including such a probeJul 12, 16Jan 07, 20VMICRO; Centre National De La Recherche Scientifique (CNRS);
10520339 Two-dimensional three-degree-of-freedom micro-motion platform structure for high-precision positioning and measurementDec 13, 17Dec 31, 19NANJING UNIV. OF AERONAUTICS AND ASTRONAUTICS; MIRACLE AUTOMATION ENGINEERING CORP. LTD.;
10488433 Positioning arm for and method of placing a scan head on a support surfaceJul 14, 16Nov 26, 19NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
10466270 Conductive probe, electrical property evaluating system, scanning probe microscope, conductive probe manufacturing method, and electrical property measuring methodSep 12, 17Nov 05, 19KABUSHIKI KAISHA TOSHIBA
10459004 Electrical contact auto-alignment strategy for highly parallel pen arrays in cantilever free scanning probe lithographyFeb 02, 18Oct 29, 19Tera-Print, LLC
10451651 Tunnel current control apparatus and tunnel current control methodAug 22, 18Oct 22, 19Hamamatsu Photonics K.K.
10444258 AM/FM measurements using multiple frequency atomic force microscopyDec 11, 17Oct 15, 19Oxford Instruments Asylum Research, Inc.
10403489 Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometryJul 18, 18Sep 03, 19Nova Measuring Instruments Inc.
10352963 Dynamic sweep-plow microcantilever device and methods of useDec 22, 16Jul 16, 19The Board of Trustees of the University of Alabama
10345335 Scanning probe microscope and scanning method thereofMar 27, 18Jul 09, 19Hitachi High-Tech Science Corporation
10337890 Integrated micro actuator and LVDT for high precision position measurementsDec 13, 16Jul 02, 19Oxford Instruments AFM Inc.
10338097 Joggle jointed detection apparatusDec 29, 15Jul 02, 19Stromlinet Nano Limited
10302673 Miniaturized and compact probe for atomic force microscopyOct 19, 17May 28, 19VMICRO; Centre National De La Recherche Scientifique (CNRS); UNIVERSITE LILLE 1 SCIENCES ET TECHNOLOGIES;
10254307 Scanning probe microscopeMar 09, 18Apr 09, 19Shimadzu Corporation
10203353 Method and system for positioning using near field transducers, particularly suited for positioning electronic chipsApr 10, 17Feb 12, 19Not available
10161958 Three-dimensional fine movement deviceJul 09, 15Dec 25, 18Hitachi High-Tech Science Corporation
10151773 Scanning probe microscope and probe contact detection methodMar 24, 17Dec 11, 18HITACHI HIGH-TECH SCIENCE CORPORATION
10126146 Piezoelectric actuator and method of measuring motion by using the sameApr 27, 15Nov 13, 18Samsung Electronics Co. Ltd.; Korea Advanced Institute of Science and Technology;

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Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2019/0324,053 SCANNING PROBE MICROSCOPEMar 01, 19Oct 24, 19Not available
2019/0277,881 METHOD FOR DETERMINING THE SHAPE OF A SAMPLE TIP FOR ATOM PROBE TOMOGRAPHYMar 07, 19Sep 12, 19Not available
2019/0250,185 SCANNING PROBE MICROSCOPE AND METHOD FOR INCREASING A SCAN SPEED OF A SCANNING PROBE MICROSCOPE IN THE STEP-IN SCAN MODEApr 26, 19Aug 15, 19Not available
2019/0219,608 SCANNING PROBE NANOTOMOGRAPH COMPRISING AN OPTICAL ANALYSIS MODULEMay 18, 17Jul 18, 19Not available
2019/0187,173 NOZZLE INSPECTION METHOD AND APPARATUSAug 29, 18Jun 20, 19Not available
2018/0321,276 METROLOGY DEVICES AND METHODS FOR INDEPENDENTLY CONTROLLING A PLURALITY OF SENSING PROBESNov 03, 16Nov 08, 18Not available
2017/0350,920 SCANNING PROBE MICROSCOPEOct 24, 14Dec 07, 17SHIMADZU CORPORATION
2017/0299,584 SELF-SENSING ARRAY OF MICROCANTILEVERS FOR CHEMICAL DETECTIONJun 29, 17Oct 19, 17BOARD OF REGENTS OF THE NEVADA SYSTEM OF HIGHER EDUCATION, ON BEHALF OF THE UNIVERSITY OF NEVADA, RENO

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Top Owners in This Subclass

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Patents Issued To Date - By Filing Year

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