G01Q 10/06

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Description

Class  G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]


Subclass 10/06: Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe Fine scanning or positioning Circuits or algorithms therefor

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
10598691 Scanning probe microscope and light intensity adjusting methodMar 01, 19Mar 24, 20SHIMADZU CORPORATION
10585114 Scanning probe systemJul 16, 19Mar 10, 20INFINITESIMA LIMITED
10564180 Scanning probe microscope using gradual increases and decreases in relative speed when shifting and reciprocating the scanned probe across a sampleApr 14, 15Feb 18, 20Shimadzu Corporation
10545170 Measuring method of scanning probe microscopy using penetrative pressing forceMar 11, 16Jan 28, 20TOSHIBA MEMORY CORPORATION
10502761 Method and apparatus of operating a scanning probe microscopeMar 03, 17Dec 10, 19Bruker Nano, Inc.
10495665 Methods, devices and systems for scanning tunneling microscopy control system designSep 18, 17Dec 03, 19Zyvex Labs, LLC; Texas and Board of Regents, The University of Texas System;
10488434 Characterizing a height profile of a sample by side view imagingJul 27, 18Nov 26, 19Anton Paar GmbH
10444259 Automatic calibration and tuning of feedback systemsAug 24, 16Oct 15, 19Technion Research & Development Foundation Limited
10427292 Linked micromechanical positioning apparatus for real-time testing and measurementOct 13, 15Oct 01, 19SENSAPEX OY
10401381 Scanning probe systemJun 10, 16Sep 03, 19INFINITESIMA LIMITED
10345337 Scanning probe microscopy utilizing separable componentsApr 13, 18Jul 09, 19Bruker Nano, Inc.
10203353 Method and system for positioning using near field transducers, particularly suited for positioning electronic chipsApr 10, 17Feb 12, 19Not available
10197596 Method and apparatus of operating a scanning probe microscopeNov 07, 17Feb 05, 19Bruker Nano, Inc.
10197595 Dual-probe scanning probe microscopeMar 22, 16Feb 05, 19Bruker Nano, Inc.
10191081 Measuring method for atomic force microscopeAug 16, 16Jan 29, 19Korea Research Institute of Standards and Science
10168353 Apparatus and methods for investigating a sample surfaceMay 12, 16Jan 01, 19Nanyang Technological University
10161959 Atomic force microscope and control method of the sameDec 20, 17Dec 25, 18OLYMPUS CORPORATION
10151773 Scanning probe microscope and probe contact detection methodMar 24, 17Dec 11, 18HITACHI HIGH-TECH SCIENCE CORPORATION
10128429 Piezoelectric positioning device and positioning method by means of such a piezoelectric positioning deviceMay 30, 17Nov 13, 18Carl Zeiss SMT GmbH
10119990 Scanning probe microscope and method for examining a surface with a high aspect ratioDec 21, 16Nov 06, 18Carl Zeiss SMT GmbH

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Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2020/0081,032 ATOMIC FORCE MICROSCOPE, ATOMIC FORCE MICROSCOPY, AND CONTROLLING METHOD OF AN ATOMIC FORCE MICROSCOPYNov 13, 19Mar 12, 20OLYMPUS CORPORATION
2020/0041,540 Scanning Probe SystemApr 06, 18Feb 06, 20Not available
2019/0353,679 HIGH-PRECISION SCANNING DEVICENov 17, 17Nov 21, 19NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
2019/0293,680 SCANNING PROBE MICROSCOPEJun 02, 16Sep 26, 19Shimadzu Corporation
2019/0094,265 AFM with Suppressed Parasitic SignalsJan 26, 17Mar 28, 19Not available
2019/0094,266 A METHOD OF OPERATING AN AFMApr 26, 17Mar 28, 19Not available
2019/0094,267 METHOD OF CONTROLLING A PROBESep 25, 18Mar 28, 19CONCEPT SCIENTIFIQUE INSTRUMENTS
2018/0299,480 SCANNING PROBE MICROSCOPEMar 28, 18Oct 18, 18Shimadzu Corporation
2018/0299,479 Force Measurement with Real-Time Baseline DeterminationMar 06, 18Oct 18, 18Not available

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Patents Issued To Date - By Filing Year

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