G01Q 20/00

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Class  G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]


Subclass 20/00: Monitoring the movement or position of the probe

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
10502761 Method and apparatus of operating a scanning probe microscopeMar 03, 17Dec 10, 19Bruker Nano, Inc.
10444258 AM/FM measurements using multiple frequency atomic force microscopyDec 11, 17Oct 15, 19Oxford Instruments Asylum Research, Inc.
10444486 Systems and methods for detection of blank fields in digital microscopesSep 04, 17Oct 15, 19MICROSCOPES INTERNATIONAL, LLC
10288643 Scanning probe microscopy system for mapping high aspect ratio nanostructures on a surface of a sampleJul 14, 16May 14, 19NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
10215773 Material property measurements using multiple frequency atomic force microscopyMar 08, 16Feb 26, 19Oxford Instruments AFM Inc
10197596 Method and apparatus of operating a scanning probe microscopeNov 07, 17Feb 05, 19Bruker Nano, Inc.
10161958 Three-dimensional fine movement deviceJul 09, 15Dec 25, 18Hitachi High-Tech Science Corporation
10145861 Detection device having attached probeDec 29, 15Dec 04, 18Stromlinet Nano Limited
10132830 Method of measuring a topographic profile and/or a topographic imageJan 19, 16Nov 20, 18ANTON PAAR TRITEC SA
10060946 Electron vibrometer and determining displacement of a cantileverMar 03, 17Aug 28, 18The United States of America as represented by the Secretary of Commerce
10048289 Motion sensor integrated nano-probe N/MEMS apparatus, method, and applicationsDec 17, 12Aug 14, 18Cornell University
10025207 Method of aligning a first article relative to a second articleMay 06, 11Jul 17, 18Universität Kassel
9995765 Method and apparatus of using peak force tapping mode to measure physical properties of a sampleMar 22, 16Jun 12, 18Bruker Nano, Inc.
9989556 Systems and devices for non-destructive surface chemical analysis of samplesFeb 09, 17Jun 05, 18Horiba Instruments Incorporated
9939460 Scanning probe system with multiple probesJun 08, 17Apr 10, 18INFINITESIMA LIMITED
9869694 Method and apparatus of electrical property measurement using an AFM operating in peak force tapping modeDec 15, 15Jan 16, 18BRUKER NANO, INC.
9810713 Method and apparatus of operating a scanning probe microscopeMar 01, 16Nov 07, 17BRUKER NANO, INC.
9766266 Method of advancing a probe tip of a scanning microscopy device towards a sample surface, and device thereforeApr 28, 15Sep 19, 17NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
9678105 Analysis of ex vivo cells for disease state detection and therapeutic agent selection and monitoringJan 03, 14Jun 13, 17THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
9658047 Component measurement system having wavelength filteringOct 23, 14May 23, 17CATERPILLAR INC.

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Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2019/0227,097 METHOD OF AND SYSTEM FOR PERFORMING DEFECT DETECTION ON OR CHARACTERIZATION OF A LAYER OF A SEMICONDUCTOR ELEMENT OR SEMI-MANUFACTURED SEMICONDUCTOR ELEMENTAug 31, 17Jul 25, 19Not available
2019/0195,910 Material Property Measurements Using Multiple Frequency Atomic Force MicroscopyFeb 26, 19Jun 27, 19Not available
2019/0018,039 MOTION SENSOR INTEGRATED NANO-PROBE N/MEMS APPARATUS, METHOD, AND APPLICATIONSJun 26, 18Jan 17, 19Cornell Research Foundation Inc. Cornell University
2018/0306,837 METHOD OF PERFORMING SURFACE MEASUREMENTS ON A SURFACE OF A SAMPLE, AND SCANNING PROBE MICROSCOPY SYSTEM THEREFOREOct 21, 16Oct 25, 18Not available

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