Class G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
Subclass 20/04: Monitoring the movement or position of the probe Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezo-electric gauge
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 12247998 | Scattering-type scanning near-field optical microscopy with Akiyama piezo-probes | Sep 22, 22 | Mar 11, 25 | The Research Foundation for the State University of New York; Yale University; |
| 12241911 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Feb 02, 24 | Mar 04, 25 | BRUKER NANO, INC. |
| 11946949 | Method and control unit for demodulation | Nov 12, 19 | Apr 02, 24 | TECHNISCHE UNIVERSITÄT WIEN |
| 11940461 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Apr 11, 23 | Mar 26, 24 | BRUKER NANO, INC. |
| 11906546 | Coated active cantilever probes for use in topography imaging in opaque liquid environments, and methods of performing topography imaging | Jul 06, 20 | Feb 20, 24 | Massachusetts Institute of Technology; Nano Analytik GMBH; Synsfuels Americas Corporation; |
| 11852654 | Cantilever with a collocated piezoelectric actuator-sensor pair | Jul 17, 20 | Dec 26, 23 | 501 Board of Regents The University of Texas System |
| 11733264 | Cantilever, scanning probe microscope, and measurement method using scanning probe microscope | Apr 30, 20 | Aug 22, 23 | HITACHI HIGH-TECH CORPORATION |
| 11714104 | AFM imaging with creep correction | May 25, 21 | Aug 01, 23 | Bruker Nano, Inc. |
| 11592460 | Scanning probe microscope, scan head and method | Dec 03, 19 | Feb 28, 23 | NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO |
| 11435378 | MEMS-based nanoindentation force sensor with electro-thermal tip heating | Jan 07, 20 | Sep 06, 22 | Femto Tools AG |
| 11307220 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Apr 19, 21 | Apr 19, 22 | BRUKER NANO, INC. |
| 11293940 | Scanning sensor having a spin defect | Mar 14, 18 | Apr 05, 22 | ETH Zurich |
| 11073535 | Scanning probe microscope with case and elastic body | Dec 27, 19 | Jul 27, 21 | Shimadzu Corporation |
| 11029330 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Aug 02, 19 | Jun 08, 21 | BRUKER NANO, INC. |
| 10895585 | Multiple integrated tips scanning probe microscope | Feb 24, 20 | Jan 19, 21 | Xallent, LLC |
| 10895584 | Method of controlling a probe using constant command signals | Sep 25, 18 | Jan 19, 21 | CONCEPT SCIENTIFIQUE INSTRUMENTS |
| 10794931 | Scanning probe microscope and cantilever moving method | Feb 25, 19 | Oct 06, 20 | SHIMADZU CORPORATION |
| 10663483 | Method and apparatus of using peak force tapping mode to measure physical properties of a sample | Jun 12, 18 | May 26, 20 | Bruker Nano, Inc. |
| 10613115 | Multiple integrated tips scanning probe microscope | Dec 13, 18 | Apr 07, 20 | Xallent, LLC |
| 10527645 | Compact probe for atomic-force microscopy and atomic-force microscope including such a probe | Jul 12, 16 | Jan 07, 20 | VMICRO; Centre National De La Recherche Scientifique (CNRS); |
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2024/0210,443 | FIDUCIAL MARKER DESIGN, FIDUCIAL MARKER, SCANNING PROBE MICROSCOPY DEVICE AND METHOD OF CALIBRATING A POSITION OF A PROBE TIP | Apr 28, 22 | Jun 27, 24 | Not available |
| 2024/0168,053 | Nano-Mechanical Infrared Spectroscopy System and Method Using Gated Peak Force IR | Nov 20, 23 | May 23, 24 | Not available |
| 2024/0110,939 | AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND SCANNING PROBE MICROSCOPY SYSTEM USING THE SAME | Feb 09, 22 | Apr 04, 24 | Not available |
| 2022/0252,638 | Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA) | Apr 18, 22 | Aug 11, 22 | BRUKER NANO, INC. |
| 2022/0120,783 | Method And Control Unit For Demodulation | Nov 12, 19 | Apr 21, 22 | Not available |
| 2019/0018,040 | Method and Apparatus of Using Peak Force Tapping Mode to Measure Physical Properties of a Sample | Jun 12, 18 | Jan 17, 19 | Not available |
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