Class G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
Subclass 30/04: Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices Display or data processing devices
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 12241911 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Feb 02, 24 | Mar 04, 25 | BRUKER NANO, INC. |
| 12153068 | Atomic-force microscopy for identification of surfaces | Sep 21, 23 | Nov 26, 24 | Trustees of Tufts College |
| 12123895 | Method of determining dimensions of features of a subsurface topography, scanning probe microscopy system and computer program | Apr 01, 21 | Oct 22, 24 | Nearfield Instruments B.V. |
| 12055560 | Automated optimization of AFM light source positioning | Mar 21, 23 | Aug 06, 24 | Oxford Instruments Asylum Research, Inc. |
| 11994533 | Methods and systems for scanning probe sample property measurement and imaging | Nov 25, 20 | May 28, 24 | The Regents of the University of Colorado a Body Corporate |
| 11965910 | Device and method for operating a bending beam in a closed control loop | Mar 30, 23 | Apr 23, 24 | Carl Zeiss SMT GmbH |
| 11940461 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | Apr 11, 23 | Mar 26, 24 | BRUKER NANO, INC. |
| 11899041 | Method for referencing a near-field measurement with drift and fluctuation correction | Jul 16, 21 | Feb 13, 24 | ATTOCUBE SYSTEMS AG |
| 11860187 | Modified method to fit cell elastic modulus based on Sneddon model | Sep 07, 20 | Jan 02, 24 | DALIAN UNIVERSITY OF TECHNOLOGY |
| 11839709 | System for tailoring dialysis treatment based on sensed potassium concentration, patient data, and population data | Oct 26, 22 | Dec 12, 23 | FRESENIUS MEDICAL CARE HOLDINGS, INC. |
| 11835546 | Characterization of nanoindented and scratch induced accoustic events | May 29, 22 | Dec 05, 23 | Nanometronix LLC |
| 11796564 | Atomic-force microscopy for identification of surfaces | Nov 04, 22 | Oct 24, 23 | Trustees of Tufts College |
| 11733186 | Device and method for analyzing a defect of a photolithographic mask or of a wafer | Apr 01, 21 | Aug 22, 23 | Carl Zeiss SMT GmbH |
| 11719534 | Computerized creation of measurement plans and plan-based control of measurement devices | Mar 05, 21 | Aug 08, 23 | Carl Zeiss Industrielle Messtechnik GmbH |
| 11656244 | Compensating control signal for raster scan of a scanning probe microscope | Nov 19, 20 | May 23, 23 | BRUKER NANO GMBH |
| 11650223 | Battery electrode analysis method | Oct 15, 19 | May 16, 23 | LG Energy Solution, Ltd. |
| 11562289 | Loosely-coupled inspection and metrology system for high-volume production process monitoring | Feb 27, 19 | Jan 24, 23 | KLA Corporation |
| 11524102 | System for tailoring dialysis treatment based on sensed potassium concentration, patient data, and population data | Jul 24, 19 | Dec 13, 22 | FRESENIUS MEDICAL CARE HOLDINGS, INC. |
| 11491267 | Method for tailoring dialysis treatment based on sensed potassium concentration in blood serum or dialysate | Jul 24, 19 | Nov 08, 22 | FRESENIUS MEDICAL CARE HOLDINGS, INC. |
| 11480588 | Method for providing a probe device for scanning probe microscopy | Nov 13, 18 | Oct 25, 22 | Nanotools GmbH |
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2024/0426,869 | METHOD AND APPARATUS FOR SCANNING A SAMPLE WITH A PROBE | Oct 07, 22 | Dec 26, 24 | Not available |
| 2024/0418,746 | SCANNING PROBE MICROSCOPE, INFORMATION PROCESSING METHOD, AND PROGRAM | Mar 24, 22 | Dec 19, 24 | Not available |
| 2024/0369,594 | MATCHING METHOD FOR SEMICONDUCTOR TOPOGRAPHY MEASUREMENT AND PROCESSING DEVICE USING THE SAME | Jun 01, 23 | Nov 07, 24 | Not available |
| 2024/0345,129 | DECOUPLED OPTICAL FORCE NANOSCOPY | Apr 12, 24 | Oct 17, 24 | Not available |
| 2024/0288,468 | METHOD OF AND SYSTEM FOR REFURBISHING A PROBE FOR USE IN A SCANNING PROBE MICROSCOPY DEVICE, AND A COMPUTER PROGRAM PRODUCT FOR PERFORMING SAID METHOD | Jun 21, 22 | Aug 29, 24 | Not available |
| 2024/0230,709 | DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL LOOP | Mar 26, 24 | Jul 11, 24 | Not available |
| 2024/0219,826 | METHOD OF REMOVING DEFECT OF MASK | Nov 29, 23 | Jul 04, 24 | Samsung Electronics Co., Ltd. |
| 2024/0168,052 | Scanning Probe Microscope, Sample Observation Processing System, and Electric Characteristic Evaluation Device | Mar 26, 21 | May 23, 24 | Not available |
| 2023/0194,566 | SYSTEMS AND METHODS FOR AUTOMATED TIP CONDITIONING FOR SCANNING TUNNELING SPECTROSCOPY | Dec 19, 22 | Jun 22, 23 | The Regents of the University of California |
| 2023/0184,807 | METHOD OF MONITORING AT LEAST ONE OF AN OVERLAY OR AN ALIGNMENT BETWEEN LAYERS OF A SEMICONDUCTOR SUBSTRATE, SCANNING PROBE MICROSCOPY SYSTEM AND COMPUTER PROGRAM | Nov 05, 21 | Jun 15, 23 | Not available |
| 2022/0357,359 | INFORMATION PROVIDING SYSTEM, SERVER DEVICE, AND ANALYZER | Mar 28, 22 | Nov 10, 22 | Not available |
| 2022/0252,638 | Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA) | Apr 18, 22 | Aug 11, 22 | BRUKER NANO, INC. |
| 2022/0082,583 | DEVICE AND METHOD FOR OPERATING A BENDING BEAM IN A CLOSED CONTROL LOOP | Aug 12, 21 | Mar 17, 22 | Not available |
| 2021/0231,704 | Battery Electrode Analysis Method | Oct 15, 19 | Jul 29, 21 | LG Chem, Ltd. |
| 2019/0361,046 | METHOD AND SYSTEM FOR DIAGNOSING MALIGNANT MELANOMA USING SCANNING PROBE MICROSCOPE | Dec 12, 17 | Nov 28, 19 | Not available |
| 2018/0180,643 | ANALYSIS METHOD OF COMPOSITION NETWORK TOPOLOGY STRUCTURE AND ANALYSIS PROGRAM THEREOF | Sep 27, 17 | Jun 28, 18 | 501 TDK Corporation |
| Upgrade to the Professional Level to view Top Owners for this Subclass.Learn More |
|---|
