Class G01Q : SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
Subclass 30/16: Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices Means for establishing or regulating a desired environmental condition within a sample chamber Vacuum environment
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 11175307 | Conductive atomic force microscopy system with enhanced sensitivity and methods of using such a system | Aug 28, 20 | Nov 16, 21 | GLOBALFOUNDRIES U.S. INC. |
| 10740948 | Apparatus and method for generating three-dimensional image of polymer solute substance which exists in liquid solvent | Jan 12, 17 | Aug 11, 20 | Hanbat National University Industry-Academic Cooperation Foundation |
| 10539590 | High magnetic field scanning probe microscope employing liquid helium-free room-temperature bore superconducting magnet | Dec 16, 16 | Jan 21, 20 | FUDAN UNIVERSITY |
| 10175263 | Sample vessel retention structure for scanning probe microscope | Jun 15, 16 | Jan 08, 19 | Bruker Nano, Inc. |
| 9689893 | Scanning probe microscope | May 31, 16 | Jun 27, 17 | HITACHI HIGH-TECH SCIENCE CORPORATION |
| 8893309 | Scanning tunneling microscope assembly, reactor, and system | Jun 22, 10 | Nov 18, 14 | THE REGENTS OF THE UNIVERSITY OF CALIFORNIA |
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2023/0176,088 | DAMPING BASE FOR MODULAR SCANNING PROBE MICROSCOPE HEAD | May 06, 21 | Jun 08, 23 | Not available |
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