Class G01R : MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
Subclass 1/02: Details of instruments or arrangements of the types included in groups G01R 5/00-G01R 13/00 and G01R 31/00 (constructional details particular to arrangements for measuring the electric consumption G01R 11/02) General constructional details (details of a kind applicable to measuring arrangements not specially adapted for a specific variable G01D 7/00)
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 11971430 | Mass-interconnect engaging device | May 05, 23 | Apr 30, 24 | Not available |
| 11965926 | Electronic component test handler having flying scan function | Apr 08, 20 | Apr 23, 24 | ATECO INC. |
| 11959941 | Probe card | Dec 27, 21 | Apr 16, 24 | Industrial Technology Research Institute |
| 11933837 | Inspection jig, and inspection device | Mar 27, 20 | Mar 19, 24 | Nidec Read Corporation |
| 11933839 | Inspection apparatus and inspection method | Oct 06, 22 | Mar 19, 24 | Tokyo Electron Limited |
| 11899058 | Automated test equipment for testing one or more devices-under-test and method for operating an automated test equipment | Nov 14, 22 | Feb 13, 24 | Advantest Corporation |
| 11899059 | Automated test equipment for testing one or more devices-under-test and method for operating an automated test equipment | Nov 15, 22 | Feb 13, 24 | Advantest Corporation |
| 11890676 | Waveguide fence support | Feb 15, 21 | Feb 06, 24 | Raytheon Missiles & Defense (RMD) |
| 11867747 | Transfer apparatus for inspection apparatus, inspection apparatus, and object inspection method using same | Jan 22, 20 | Jan 09, 24 | Koh Young Technology Inc. |
| 11852679 | Circuit board for semiconductor test | Apr 14, 22 | Dec 26, 23 | MPI Corporation |
| 11828793 | Testing apparatus for temperature testing of electronic devices | Aug 26, 21 | Nov 28, 23 | Western Digital Technologies, Inc. |
| 11828789 | Test apparatus and jumper thereof | Apr 14, 22 | Nov 28, 23 | Star Technologies Inc. |
| 11828797 | Probing device | May 06, 22 | Nov 28, 23 | NANYA TECHNOLOGY CORPORATION |
| 11821913 | Shielded socket and carrier for high-volume test of semiconductor devices | Sep 30, 21 | Nov 21, 23 | ADVANTEST TEST SOLUTIONS, INC. |
| 11821942 | Apparatus and method for probing device-under-test | Aug 30, 21 | Nov 21, 23 | Taiwan Semiconductor Manufacturing Company Ltd. |
| 11815549 | Electronic component handler, electronic component tester, and method of detecting position of pocket | Feb 23, 21 | Nov 14, 23 | NS Technologies, Inc. |
| 11802906 | Electronic component test handler having hand teaching function and hand teaching method using same | Apr 08, 20 | Oct 31, 23 | ATECO INC. |
| 11802907 | Stacker of electronic component test handler, and electronic component test handler including same | Apr 08, 20 | Oct 31, 23 | ATECO INC. |
| 11796566 | Wafer probe device | Jun 22, 21 | Oct 24, 23 | Winbond Electronics Corp. |
| 11789063 | Conduction inspection jig, and inspection method of printed wiring board | Sep 29, 21 | Oct 17, 23 | Ibiden Co. Ltd. |
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2023/0045,809 | METHOD FOR AUTOMATICALLY CLEANING A PROBE CARD AND SYSTEM FOR AUTOMATICALLY PERFORMING A NEEDLE CLEANING | Aug 11, 21 | Feb 16, 23 | Not available |
| 2023/0045,153 | METHOD AND APPARATUS FOR DISPLAYING MEASUREMENT PARAMETERS | Jan 13, 21 | Feb 09, 23 | Schneider Electric Industries SAS |
| 2022/0404,393 | Testing Device for a Medium Voltage Starter | Jun 16, 22 | Dec 22, 22 | Not available |
| 2022/0206,040 | SWITCHING MATRIX SYSTEM AND OPERATING METHOD THEREOF FOR SEMICONDUCTOR CHARACTERISTIC MEASUREMENT | Dec 30, 20 | Jun 30, 22 | Not available |
| 2022/0137,091 | MULTI-USER TEST INSTRUMENT | Oct 29, 21 | May 05, 22 | Tektronix, Inc. |
| 2020/0200,819 | AUTOMATED TEST EQUIPMENT (ATE) SUPPORT FRAMEWORK FOR SOLID STATE DEVICE (SSD) ODD SECTOR SIZES AND PROTECTION MODES | Dec 20, 18 | Jun 25, 20 | Not available |
| 2018/0356,443 | INSTRUMENT KNOB BACKLIGHT STRUCTURE AND INSTRUMENT | Oct 16, 15 | Dec 13, 18 | Not available |
| 2016/0231,354 | Dynamically Configurable Remote Instrument Interface | Feb 04, 16 | Aug 11, 16 | KEITHLEY INSTRUMENTS, LLC |
| 2016/0178,660 | METER PULLER HAVING GRIPPING INSERTS | Feb 29, 16 | Jun 23, 16 | KILVERT, LLC |
| 2014/0184,263 | SENSOR SYSTEM AND COVER DEVICE FOR A SENSOR SYSTEM | Dec 19, 13 | Jul 03, 14 | ROBERT BOSCH GMBH |
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