| 11971430 | Mass-interconnect engaging device | May 05, 23 | Apr 30, 24 | Not available |
| 11971449 | Probe head for a testing apparatus of electronic devices with enhanced filtering properties | Oct 15, 21 | Apr 30, 24 | Technoprobe S.p.A, |
| 11971463 | Temperature compensated MTJ-based sensing circuit for measuring an external magnetic field | Feb 22, 21 | Apr 30, 24 | ALLEGRO MICROSYSTEMS, LLC |
| 11973301 | Probes having improved mechanical and/or electrical properties for making contact between electronic circuit elements and methods for making | Feb 24, 22 | Apr 30, 24 | Microfabrica Inc. |
| 11965911 | Inspection apparatus having a contactor for inspecting electrical characteristics of an object, a contactor tip position adjusting unit, and a position adjusting method therefor | May 25, 22 | Apr 23, 24 | Kabushiki Kaisha Nihon Micronics |
| 11965926 | Electronic component test handler having flying scan function | Apr 08, 20 | Apr 23, 24 | ATECO INC. |
| 11959940 | Contact probe | Mar 24, 20 | Apr 16, 24 | Yokowo Co., Ltd. |
| 11959941 | Probe card | Dec 27, 21 | Apr 16, 24 | Industrial Technology Research Institute |
| 11946881 | Inspection apparatus and inspection method using same | Apr 13, 22 | Apr 02, 24 | Samsung Electronics Co. Ltd. |
| 11940463 | Particle measurement device, three-dimensional shape measurement device, prober device, particle measurement system, and particle measurement method | Aug 31, 23 | Mar 26, 24 | Tokyo Seimitsu Co., Ltd. |
| 11940464 | Optical probe for process Raman spectroscopy and method of use | Feb 14, 20 | Mar 26, 24 | Endress+Hauser Optical Analysis, Inc. |
| 11940466 | Ceramic, probe guiding member, probe card, and socket for package inspection | Oct 19, 18 | Mar 26, 24 | FERROTEC MATERIAL TECHNOLOGIES CORPORATION |
| 11940467 | Sensor arrangement | Mar 14, 19 | Mar 26, 24 | Robert Bosch GmbH |
| 11940485 | Inspection apparatus and inspection method | Oct 17, 19 | Mar 26, 24 | Tokyo Electron Limited |
| 11933818 | Probe test card and method of manufacturing the same | Dec 08, 22 | Mar 19, 24 | SK HYNIX INC. |
| 11933837 | Inspection jig, and inspection device | Mar 27, 20 | Mar 19, 24 | Nidec Read Corporation |
| 11933839 | Inspection apparatus and inspection method | Oct 06, 22 | Mar 19, 24 | Tokyo Electron Limited |
| 11927603 | Probes that define retroreflectors, probe systems that include the probes, and methods of utilizing the probes | Sep 27, 22 | Mar 12, 24 | FormFactor, Inc. |
| 11921131 | Method for manufacturing a measurement probe, and measurement probe | Mar 18, 21 | Mar 05, 24 | Rohde & Schwarz GmbH & Co. KG |
| 11921133 | Testing head having improved frequency properties | Jun 05, 23 | Mar 05, 24 | Technoprobe S.p.A, |
