G01T 1/166

Sub-Class

Watch 1Status Updates

Stats

Description

Class  G01T : MEASUREMENT OF NUCLEAR OR X-RADIATION


Subclass 1/166: Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation (G01T 3/00, G01T 5/00 take precedence) Measuring radiation intensity (G01T 1/29 takes precedence) Applications in the field of nuclear medicine, e.g. in vivo counting Scintigraphy involving relative movement between detector and subject

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
12085521 Small-angle X-ray scatterometryApr 27, 23Sep 10, 24BRUKER TECHNOLOGIES LTD.
12044814 Close-range positron emission tomography modules and systemMar 20, 20Jul 23, 24THE ARIZONA BOARD OF REGENTS on behalf of THE UNIVERSITY OF ARIZONA
11947053 Weighting detector configurations in SPECT imagingJan 10, 23Apr 02, 24MOLECULAR DYNAMICS LIMITED
11828887 Radioactivity measurement method and radioactivity measurement systemJan 02, 18Nov 28, 23KOREA HYDRO & NUCLEAR POWER CO., LTD.
11723608 Transformable gamma camerasJul 31, 20Aug 15, 23KROMEK GROUP, PLC
11707239 Radiological imaging device for lower limbsJun 13, 22Jul 25, 23Imaginalis S.r.l.
11703464 Small-angle x-ray scatterometryOct 20, 21Jul 18, 23BRUKER TECHNOLOGIES LTD.
11681054 Position-signal processing method for flat panel gamma imaging probeNov 18, 21Jun 20, 23Institute of Nuclear Energy Research, Atomic Energy Council, Executive Yuan, R.O.C.
11579315 Weighting detector configurations in SPECT imagingJan 28, 22Feb 14, 23MOLECULAR DYNAMICS LIMITED
11366239 Hybrid dosimetry and imaging systemJul 31, 19Jun 21, 22Varex Imaging Corporation
11357460 Radiological imaging device for lower limbsMar 23, 20Jun 14, 22Imaginalis S.r.l.
11313980 Radiation detection apparatusJul 11, 18Apr 26, 22SONY SEMICONDUCTOR SOLUTIONS CORPORATION
11249198 Weighting detector configurations in SPECT imagingFeb 06, 18Feb 15, 22Molecular Dynamics Limited
11221423 Processing apparatus, sysyem, X-ray measurement method, and programOct 23, 20Jan 11, 22Rigaku Corporation
11209556 Multilayer pixelated scintillator with enlarged fill factorAug 22, 18Dec 28, 21Koninklijke Philips N.V.
11181490 Small-angle x-ray scatterometryJul 04, 19Nov 23, 21BRUKER TECHNOLOGIES LTD.
11029417 Radioactivity measurement method and radioactivity measurement system using data expansionJan 02, 18Jun 08, 21KOREA HYDRO & NUCLEAR POWER CO., LTD.
10866329 System and method to unpile overlapping pulsesJun 02, 17Dec 15, 20Siemens Medical Solutions USA, Inc.
10820881 Method for analyzing and correcting measurement variability in PET imagesAug 04, 14Nov 03, 20ADM DIAGNOSTICS, INC.
10772582 Multi-modal emission tomography quality based on patient and applicationMar 20, 18Sep 15, 20Siemens Medical Solutions USA, Inc.

more results

Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2025/0114,057 SYSTEMS AND METHODS FOR CONTROLLING MOTION OF DETECTORS HAVING MOVING DETECTOR HEADSDec 17, 24Apr 10, 25Not available
2024/0377,342 Small-Angle X-Ray ScatterometryJul 25, 24Nov 14, 24Not available
2024/0077,435 Small-angle x-ray scatterometryApr 27, 23Mar 07, 24Not available
2023/0152,474 WEIGHTING DETECTOR CONFIGURATIONS IN SPECT IMAGINGJan 10, 23May 18, 23MOLECULAR DYNAMICS LIMITED
2023/0147,897 DETECTION DEVICEOct 20, 22May 11, 23InnoCare Optoelectronics Corporation
2022/0291,399 METHOD AND APPARATUS FOR TRAINING NUCLIDE IDENTIFICATION MODELFeb 15, 22Sep 15, 22Korea Atomic Energy Research Institute
2020/0261,043 TIME-OF-FLIGHT POSITRON EMISSION TOMOGRAPHY (TOFPET) ASSEMBLY AND RELATED METHOD THEREOFDec 19, 16Aug 20, 20University of Virginia Patent Foundation
2020/0193,654 SYSTEM AND METHOD FOR STATISTICAL ITERATIVE RECONSTRUCTION AND MATERIAL DECOMPOSITIONDec 17, 18Jun 18, 20Not available
2019/0310,382 BEAM DETECTION AND FILTERING NOISEJun 26, 17Oct 10, 19Not available
2019/0101,655 SYSTEMS AND METHODS FOR POSITRON EMISSION TOMOGRAPHY IMAGE RECONSTRUCTIONSep 30, 17Apr 04, 19UIH AMERICA, INC.

more results

Top Owners in This Subclass

Upgrade to the Professional Level to view Top Owners for this Subclass.Learn More

Patents Issued To Date - By Filing Year

Average Time to Issuance