Description
Class G21K : TECHNIQUES FOR HANDLING PARTICLES OR ELECTROMAGNETIC RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA- OR X-RAY MICROSCOPES
Subclass 7/00: Gamma ray or X-ray microscopes
G21K 7/00
Sub-Class
Stats
- 418 US PATENTS IN FORCE
- 6 US APPLICATIONS PENDING
- 130 Total Patent Owners
- 2,108 TOTAL INVENTORS
Recent Patents
| Patent # | Title | Filing Date | Issue Date | Patent Owner |
|---|---|---|---|---|
| 12241848 | Inspection apparatus and inspection method | Jul 11, 23 | Mar 04, 25 | Canon Anelva Corporation |
| 12237094 | Fourier ptychographic imaging systems, devices, and methods | Nov 18, 21 | Feb 25, 25 | California Institute of Technology |
| 12106867 | Method for scanning a sample by means of X-ray optics and an apparatus for scanning a sample | Aug 13, 15 | Oct 01, 24 | BRUKER NANO GMBH |
| 12056894 | Method for imaging a region of interest of a sample using a tomographic X-ray microscope, microscope, system and computer program | Sep 09, 21 | Aug 06, 24 | Carl Zeiss SMT, Inc. |
| 12040103 | Imaging optical arrangement to image an object illuminated by X-rays | Aug 16, 21 | Jul 16, 24 | Carl Zeiss SMT GmbH |
| 11977038 | Inspection apparatus and inspection method | Jul 11, 23 | May 07, 24 | Canon Anelva Corporation |
| 11971370 | Inspection apparatus and inspection method | Jul 11, 23 | Apr 30, 24 | Canon Anelva Corporation |
| 11940394 | Inspection apparatus and inspection method | Jul 11, 23 | Mar 26, 24 | Canon Anelva Corporation |
| 11927554 | Inspection apparatus and inspection method | Jul 11, 23 | Mar 12, 24 | Canon Anelva Corporation |
| 11921059 | Inspection apparatus and inspection method | Jul 11, 23 | Mar 05, 24 | Canon Anelva Corporation |
| 11894160 | Light field X-ray optics | May 23, 19 | Feb 06, 24 | Lawrence Livermore National Security, LLC |
| 11821860 | Optical three-dimensional scanning for collision avoidance in microscopy system | Oct 14, 20 | Nov 21, 23 | Carl Zeiss X-ray Microscopy, Inc. |
| 11817231 | Detection system for X-ray inspection of an object | Aug 16, 21 | Nov 14, 23 | Carl Zeiss SMT GmbH; Carl Zeiss X-ray Microscopy, Inc.; |
| 11817669 | Table-top ultra supercontinuum and higher harmonic generation source for microscopy | Nov 22, 21 | Nov 14, 23 | Not available |
| 11730434 | Specimen radiography system comprising cabinet and a specimen drawer positionable by a controller in the cabinet | Jul 06, 21 | Aug 22, 23 | Hologic Inc. |
| 11567096 | Sensing for automated biological cell injection | Oct 31, 17 | Jan 31, 23 | Mekonos Limited |
| 11494901 | Digital telepathology and virtual control of a microscope using edge computing | May 21, 20 | Nov 08, 22 | Saint Louis University |
| 11402342 | System and method for high-resolution high contrast x-ray ghost diffraction | Feb 10, 19 | Aug 02, 22 | BAR - ILAN University |
| 11373778 | Devices processed using x-rays | Feb 10, 20 | Jun 28, 22 | Bruker Nano, Inc. |
| 11307152 | X-ray photoemission apparatus for inspection of integrated devices | Nov 20, 19 | Apr 19, 22 | Not available |
Recent Publications
| Publication # | Title | Filing Date | Pub Date | Patent Owner |
|---|---|---|---|---|
| 2024/0369,502 | INSPECTION APPARATUS AND INSPECTION METHOD | Jul 18, 24 | Nov 07, 24 | CANON ANELVA CORPORATION |
| 2024/0312,665 | FREESTANDING HIGH-ASPECT-RATIO GOLD MASKS FOR LOW-ENERGY, PHASE-BASED X-RAY MICROSCOPY | Oct 06, 23 | Sep 19, 24 | Creatv MicroTech Inc. |
| 2024/0096,515 | IMAGING DEVICE AND IMAGE GENERATION METHOD | Aug 25, 23 | Mar 21, 24 | Not available |
| 2021/0082,595 | FOURIER PTYCHOGRAPHIC IMAGING SYSTEMS, DEVICES, AND METHODS | May 01, 20 | Mar 18, 21 | California Institute of Technology |
| 2018/0204,647 | STATISTICAL ANALYSIS IN X-RAY IMAGING | Jan 16, 17 | Jul 19, 18 | FEI Company |
| 2004/0247,073 | High resolution X-ray system | Jun 03, 03 | Dec 09, 04 | MENTOR TECHNOLOGIES, INC. |
Top Owners in This Subclass
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Patents Issued To Date - By Filing Year
Average Time to Issuance
- 27 Months (last 2 years Issuances)
- 27 Months (last 5 years Issuances)