H05H 1/00

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Class  H05H : PLASMA TECHNIQUE


Subclass 1/00: Generating plasma; Handling plasma (application of plasma technique in thermonuclear fusion reactors G21B 1/00)

Recent Patents

Patent #TitleFiling DateIssue DatePatent Owner
11972931 Light emitting sealed body, light emitting unit, and light source deviceDec 21, 20Apr 30, 24Hamamatsu Photonics K.K.; ENERGETIQ TECHNOLOGY, INC.;
11961720 Device for detecting plasma of ultra fast with multi channelOct 12, 21Apr 16, 24T.O.S Co., Ltd.
11948774 Glow plasma gas measurement signal processingApr 06, 21Apr 02, 24Servomex Group Limited
11924956 Systems and methods for Thomson scattering background interference suppressionJun 22, 21Mar 05, 24The Texas A&M University System
11865572 Depositing of material by spraying precursor using supercritical fluidMar 04, 21Jan 09, 24Nova Engineering Films, Inc.
11856682 Method for measuring plasma ion nonextensive parameterFeb 08, 23Dec 26, 23Nanchang University
11849531 Underwater plasma generating apparatusMay 16, 18Dec 19, 23K FUSION TECHNOLOGY INC.
11810679 Mitigating plasma instabilityNov 22, 22Nov 07, 23X Development LLC
11800627 Probe for measuring plasma parametersJun 25, 19Oct 24, 23RUHR-UNIVERSITÄT BOCHUM
11764034 Plasma processing method and plasma processing apparatusMay 19, 20Sep 19, 23Tokyo Electron Limited
11515050 Mitigating plasma instabilityNov 12, 20Nov 29, 22X Development LLC
11464558 Plasma accessoryAug 26, 19Oct 11, 22U.S. Patent Innovations LLC
11371960 Microscale gas breakdown device and processJul 26, 19Jun 28, 22Board of Trustees of Michigan State University
11355325 Methods and systems for monitoring input power for process control in semiconductor process systemsDec 17, 20Jun 07, 22APPLIED MATERIALS, INC.
11324104 Magnetic probe deviceJul 19, 19May 03, 22Dalian University of Technology
11295959 Method of determining plasma abnormality, method of manufacturing semiconductor device, and substrate processing apparatusFeb 07, 20Apr 05, 22Kokusai Electric Corporation
11259396 Plasma generation systemApr 04, 17Feb 22, 22FUJI CORPORATION
11153960 Plasma-based electro-optical sensing and methodsJun 10, 19Oct 19, 21Innoveering, LLC
11129268 Ignition apparatus including spark plug that generates plasmaMar 07, 18Sep 21, 21DENSO Corporation; PLASMA APPLICATIONS CO., LTD.;
11049754 Method for controlling semiconductor processJul 10, 18Jun 29, 21Samsung Electronics Co., Ltd.

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Recent Publications

Publication #TitleFiling DatePub DatePatent Owner
2024/0116,074 DEPOSITING OF MATERIAL BY SPRAYING PRECURSOR USING SUPERCRITICAL FLUIDDec 04, 23Apr 11, 24Not available
2024/0098,855 LOCALIZED HEATING DEVICE AND LOCALIZED HEATING SYSTEM HAVING THE SAMEDec 07, 22Mar 21, 24Not available
2024/0098,866 MICROWAVE PLASMA TREATMENT DEVICEJan 25, 22Mar 21, 24Japan as represented by Director General of National Institute of Advanced Industrial Science and Technology Ministry of Economy Trade and Industry
2024/0090,111 MULTIPLE PLASMA ION SOURCE FOR INLINE SECONDARY ION MASS SPECTROMETRYSep 09, 22Mar 14, 24Not available
2024/0074,024 STEERED INDUCTIVELY COUPLED PLASMAAug 29, 22Feb 29, 24Not available
2024/0038,512 Measurement Apparatus for Alternating Currents and Voltages of Physical Plasmas, Particularly of Cold Plasmas at Atmospheric Pressure, and Plasma Generator Comprising Such a Measurement ApparatusJul 27, 23Feb 01, 24Not available
2022/0386,441 DEVICE FOR CONTAINING AND ACCELERATING PLASMA WITHIN A MIXER/COMPRESSOR SYSTEM BY WAY OF MAGNETIC FORCES AND THE COANDA EFFECTMay 31, 21Dec 01, 22Not available
2022/0338,337 Langmuir Probe Operating at Fixed VoltagesApr 16, 21Oct 20, 22Not available
2022/0308,464 METHOD AND DEVICE FOR CLEANING SUBSTRATESJul 06, 21Sep 29, 22Not available
2022/0110,206 METHOD FOR MEASURING PLASMA ELECTRON NONEXTENSIVE PARAMETERDec 17, 21Apr 07, 22Not available
2022/0061,146 SYSTEM AND METHOD FOR PLASMA-SURFACE-TREATMENT OF CYLINDRIC AND ANNULAR WORKPIECES USING ATMOSPHERIC-PRESSURE PLASMA GENERATORNov 04, 21Feb 24, 22Not available
2021/0410,263 Systems and Methods for Thomson Scattering Background Interference SuppressionJun 22, 21Dec 30, 21The Texas A&M University System
2021/0307,151 Air Leak Detection In Plasma Processing Apparatus With Separation GridJun 14, 21Sep 30, 21Not available
2021/0289,612 PLASMA MEASURING APPARATUS AND PLASMA MEASURING METHODMar 04, 21Sep 16, 21Tokyo Electron Limited
2020/0383,196 METHOD AND SYSTEM FOR MEASURING PLASMA EMISSIONS IN A PLASMA PROCESSING REACTORApr 13, 18Dec 03, 20Not available
2020/0154,555 FLOW FIELD VISUALIZATION DEVICE, FLOW FIELD OBSERVATION METHOD, AND PLASMA GENERATORDec 17, 18May 14, 20Industrial Technology Research Institute
2020/0092,976 PLASMA POWER GENERATOR (Z-box and Z-tower)May 11, 19Mar 19, 20Not available
2020/0092,975 NON-LINEAR OPTICAL SIMULATOR FOR COLLISIONAL PLASMASSep 19, 18Mar 19, 20Not available
2012/0199,554 DECORATIVE SURFACE FINISH AND METHOD OF FORMING SAMEApr 19, 12Aug 09, 12Not available

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Patents Issued To Date - By Filing Year

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