| 2024/0110,939 | AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND SCANNING PROBE MICROSCOPY SYSTEM USING THE SAME | Feb 09, 22 | Apr 04, 24 | Not available |
| 2022/0299,544 | ATOMIC NANO-POSITIONING DEVICE | Aug 31, 20 | Sep 22, 22 | NATIONAL RESEARCH COUNCIL OF CANADA; The Governors of the University of Alberta; |
| 2022/0146,548 | APPARATUS AND METHOD FOR A SCANNING PROBE MICROSCOPE | Jan 25, 22 | May 12, 22 | Not available |
| 2021/0349,125 | SURFACE ANALYSIS DEVICE | Oct 11, 19 | Nov 11, 21 | Not available |
| 2020/0049,733 | SCANNER AND SCANNING PROBE MICROSCOPE | Dec 07, 17 | Feb 13, 20 | Osaka University |
| 2018/0348,254 | COUPLED MULTISCALE POSITIONING OF ARRAYS OF PARALLEL, INDEPENDENTLY ACTUATED AND SIMULTANEOUSLY DRIVEN MODULAR SCANNING PROBE MICROSCOPES FOR HIGH-THROUGHPUT, IN-LINE, NANOSCALE MEASUREMENT OF FLEXIBLE, LARGE AREA, AND ROLL-TO-ROLL PROCESSES | May 31, 18 | Dec 06, 18 | Not available |
| 2018/0292,432 | AM/FM MEASUREMENTS USING MULTIPLE FREQUENCY ATOMIC FORCE MICROSCOPY | Dec 11, 17 | Oct 11, 18 | Not available |
| 2018/0074,092 | INFORMATION ACQUIRING METHOD IN ATOMIC FORCE MICROSCOPE | Nov 15, 17 | Mar 15, 18 | OLYMPUS CORPORATION |
| 2017/0285,067 | SCANNING PROBE MICROSCOPE AND PROBE CONTACT DETECTION METHOD | Mar 24, 17 | Oct 05, 17 | HITACHI HIGH-TECH SCIENCE CORPORATION |
| 2017/0254,834 | Modular Atomic Force Microscope | Mar 22, 17 | Sep 07, 17 | Not available |
| 2017/0131,322 | AM/FM Measurements Using Multiple Frequency of Atomic Force Microscopy | Sep 26, 16 | May 11, 17 | Not available |
| 2015/0301,078 | SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL PRE-CHARACTERIZATION OF A SAMPLE FOR FAST AND NON-DESTRUCTIVE ON SAMPLE NAVIGATION DURING NANOPROBING | Nov 24, 14 | Oct 22, 15 | DCG SYSTEMS, INC. |
| 2015/0241,468 | METHOD AND APPARATUS FOR AUTOMATED SCANNING PROBE MICROSCOPY | Feb 24, 15 | Aug 27, 15 | NUOMEDIS AG |
| 2015/0241,469 | PRECISE PROBE PLACEMENT IN AUTOMATED SCANNING PROBE MICROSCOPY SYSTEMS | Feb 24, 15 | Aug 27, 15 | BRUKER NANO, INC. |
| 2012/0110,707 | Metrology Probe and Method of Configuring a Metrology Probe | May 28, 10 | May 03, 12 | THE RESEARCH FOUNDATION FOR THE STATE UNIVERSITY OF NEW YORK |
| 2011/0203,020 | Atomic force microscopes and methods of measuring specimens using the same | Feb 08, 11 | Aug 18, 11 | SAMSUNG ELECTRONICS CO., LTD. |
| 2011/0055,982 | A SCANNING PROBE MICROSCOPE AND A MEASURING METHOD USING THE SAME | Jul 01, 10 | Mar 03, 11 | HITACHI, LTD. |
| 2010/0251,438 | MICROSCOPY CONTROL SYSTEM AND METHOD | Mar 16, 10 | Sep 30, 10 | NATIONAL UNIVERSITY OF IRELAND, GALWAY, ROYAL COLLEGE OF SURGEONS IN IRELAND, |