| 2024/0118,310 | DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE | Jan 20, 22 | Apr 11, 24 | Not available |
| 2023/0168,274 | PROBE TIP X-Y LOCATION IDENTIFICATION USING A CHARGED PARTICLE BEAM | Nov 29, 22 | Jun 01, 23 | Not available |
| 2020/0191,826 | Method and Apparatus of Operating a Scanning Probe Microscope | Dec 10, 19 | Jun 18, 20 | Not available |
| 2019/0227,097 | METHOD OF AND SYSTEM FOR PERFORMING DEFECT DETECTION ON OR CHARACTERIZATION OF A LAYER OF A SEMICONDUCTOR ELEMENT OR SEMI-MANUFACTURED SEMICONDUCTOR ELEMENT | Aug 31, 17 | Jul 25, 19 | Not available |
| 2019/0195,910 | Material Property Measurements Using Multiple Frequency Atomic Force Microscopy | Feb 26, 19 | Jun 27, 19 | Not available |
| 2019/0018,039 | MOTION SENSOR INTEGRATED NANO-PROBE N/MEMS APPARATUS, METHOD, AND APPLICATIONS | Jun 26, 18 | Jan 17, 19 | Cornell Research Foundation Inc. Cornell University |
| 2018/0306,837 | METHOD OF PERFORMING SURFACE MEASUREMENTS ON A SURFACE OF A SAMPLE, AND SCANNING PROBE MICROSCOPY SYSTEM THEREFORE | Oct 21, 16 | Oct 25, 18 | Not available |
| 2018/0136,251 | Method and Apparatus of Operating a Scanning Probe Microscope | Nov 07, 17 | May 17, 18 | Not available |
| 2017/0261,533 | ELECTRON VIBROMETER AND DETERMINING DISPLACEMENT OF A CANTILEVER | Mar 03, 17 | Sep 14, 17 | THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE |
| 2017/0138,982 | METHOD OF MEASURING A TOPOGRAPHIC PROFILE AND/OR A TOPOGRAPHIC IMAGE | Jan 19, 16 | May 18, 17 | ANTON PAAR TRITEC SA |
| 2017/0052,210 | MEASURING METHOD FOR ATOMIC FORCE MICROSCOPE | Aug 16, 16 | Feb 23, 17 | KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE |
| 2016/0313,367 | Method and Apparatus of Operating a Scanning Probe Microscope | Apr 25, 16 | Oct 27, 16 | Not available |
| 2016/0258,979 | Method and Apparatus of Operating a Scanning Probe Microscope | Mar 01, 16 | Sep 08, 16 | BRUKER NANO, INC. |
| 2016/0258,980 | Material Property Measurements Using Multiple Frequency Atomic Force Microscopy | Mar 08, 16 | Sep 08, 16 | Not available |
| 2016/0187,374 | MINUTE OBJECT CHARACTERISTICS MEASURING APPARATUS | Dec 28, 15 | Jun 30, 16 | RICOH COMPANY, LTD. |
| 2016/0047,841 | SIGNAL DETECTION CIRCUIT AND SCANNING PROBE MICROSCOPE | Mar 04, 14 | Feb 18, 16 | NATIONAL UNIVERSITY CORPORATION KANAZAWA UNIVERSITY |
| 2016/0025,770 | SCANNING PROBE MICROSCOPE AND SCANNING PROBE MICROSCOPY | Oct 02, 15 | Jan 28, 16 | OLYMPUS CORPORATION |
| 2015/0369,838 | METHOD AND DEVICE FOR CONTROLLING A SCANNING PROBE MICROSCOPE | Dec 12, 13 | Dec 24, 15 | UNIVERSITY OF BASEL |
| 2015/0369,839 | DESIGN AND INTERFACE OF A MICROFABRICATED SCANNING FORCE SENSOR FOR COMBINED FORCE AND POSITION SENSING | Jun 17, 15 | Dec 24, 15 | Femtotools AG |
| 2015/0355,226 | Methods, Devices, and Systems for Forming Atomically Precise Structures | Mar 13, 14 | Dec 10, 15 | ZYVEX LABS, LLC |