| 2024/0151,742 | TRANSITIONAL TAPPING ATOMIC FORCE MICROSCOPY FOR HIGH-RESOLUTION IMAGING | Mar 15, 22 | May 09, 24 | Not available |
| 2024/0133,918 | METHOD FOR OBTAINING THE EQUIVALENT OXIDE THICKNESS OF A DIELECTRIC LAYER | Apr 12, 23 | Apr 25, 24 | Not available |
| 2024/0133,919 | METHOD OF REMOVING AND COLLECTING PARTICLES FROM PHOTOMASK AND DEVICE FOR REMOVING AND COLLECTING PARTICLES THEREFROM | Jul 18, 23 | Apr 25, 24 | Not available |
| 2024/0126,061 | SCANNING PROBE MICROSCOPE | Oct 16, 23 | Apr 18, 24 | Not available |
| 2024/0118,310 | DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE | Jan 20, 22 | Apr 11, 24 | Not available |
| 2024/0110,939 | AUTOMATED LANDING METHOD OF A SCANNING PROBE MICROSCOPY SYSTEM AND SCANNING PROBE MICROSCOPY SYSTEM USING THE SAME | Feb 09, 22 | Apr 04, 24 | Not available |
| 2024/0094,240 | OPTOMECHANICAL TRANSDUCER | Jan 21, 22 | Mar 21, 24 | Not available |
| 2024/0094,241 | HIGH-FREQUENCY ENHANCED ELECTROCHEMICAL STRAIN MICROSCOPE AND HIGH-FREQUENCY ENHANCED ELECTROCHEMICAL STRAIN MICROSCOPY USING THE SAME | Dec 25, 20 | Mar 21, 24 | Not available |
| 2024/0087,869 | SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANALYSIS USING SECONDARY ION MASS SPECTROMETRY | Sep 18, 23 | Mar 14, 24 | NOVA MEASURING INSTRUMENTS INC. |
| 2024/0077,516 | SYSTEM, METHOD, COMPUTER-ACCESSIBLE MEDIUM AND APPARATUS FOR DNA MAPPING | Aug 08, 23 | Mar 07, 24 | Not available |
| 2024/0069,064 | PROBE ASSESSMENT METHOD AND SPM | Jun 09, 21 | Feb 29, 24 | Shimadzu Corporation |
| 2024/0069,095 | DEFECT DETECTION USING THERMAL LASER STIMULATION AND ATOMIC FORCE MICROSCOPY | Aug 26, 22 | Feb 29, 24 | Not available |
| 2024/0061,014 | LEVEL DIFFERENCE MEASURING APPARATUS AND METHOD OF CALCULATING LEVEL DIFFERENCE | Aug 10, 23 | Feb 22, 24 | Kioxia Corporation |
| 2024/0044,938 | NANOSCALE SCANNING SENSORS | Oct 12, 23 | Feb 08, 24 | President and Fellows of Harvard College |
| 2024/0027,425 | METHODS AND SYSTEMS FOR ANALYTE DETECTION AND ANALYSIS | Jul 20, 23 | Jan 25, 24 | Not available |
| 2024/0027,491 | CASSETTE FOR HOLDING A PROBE | Nov 26, 21 | Jan 25, 24 | Not available |
| 2024/0012,022 | Atomic-force Microscopy for Identification of Surfaces | Sep 21, 23 | Jan 11, 24 | Not available |
| 2024/0012,021 | ATOMIC FORCE MICROSCOPE | Aug 18, 21 | Jan 11, 24 | Not available |
| 2024/0002,220 | SELF-PACKING THREE-ARM THERMAL SCANNING PROBE FOR MICRO-NANO MANUFACTURING | Jun 18, 21 | Jan 04, 24 | Not available |
| 2023/0417,795 | CONTROLLED CREATION OF SUB-50 NM DEFECTS IN 2D MATERIALS AT LOW TEMPERATURE | Jun 14, 23 | Dec 28, 23 | University of Central Florida Research Foundation, Inc. |