G01Q 30/00

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Patent/Pub #TitleFiling DateIssue/Publication DatePatent Owner
9939460 Scanning probe system with multiple probesJun 08, 17Apr 10, 18INFINITESIMA LIMITED
9404855 Method to obtain absorption spectra from near-field infrared scattering using homo-dyne detectionNov 27, 13Aug 02, 16Not available
9252004 Ionization device, mass spectrometry apparatus, mass spectrometry method, and imaging systemJul 30, 14Feb 02, 16CANON KABUSHIKI KAISHA
8997259 Method and apparatus of tuning a scanning probe microscopeNov 12, 12Mar 31, 15BRUKER NANO, INC.
8914909 Frequency measuring and control apparatus with integrated parallel synchronized oscillatorsMar 17, 11Dec 16, 14RHK TECHNOLOGY, INC.
8887311 Scanning probe microscopeNov 08, 13Nov 11, 14SHIMADZU CORPORATION
8860260 High-scan rate positioner for scanned probe microscopyDec 17, 12Oct 14, 14MASSACHUSETTS INSTITUTE OF TECHNOLOGY
8646111 Coupled mass-spring systems and imaging methods for scanning probe microscopyFeb 13, 07Feb 04, 14THE REGENTS OF THE UNIVERSITY OF CALIFORNIA
8583396 Impedance-scanning quartz crystal microbalanceNov 10, 08Nov 12, 13C3 PROZESS- UND ANALYSENTECHNICK GMBH, C3 Prozess-und Analysentechnik GmbH,
8479309 Ultra-low damping imaging mode related to scanning probe microscopy in liquidApr 28, 11Jul 02, 13THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
8448502 Band excitation method applicable to scanning probe microscopyJun 02, 10May 28, 13UT-BATTELLE, LLC
8308968 Monolithic high aspect ratio nano-size scanning probe microscope (SPM) tip formed by nanowire growthAug 05, 09Nov 13, 12GLOBALFOUNDRIES INC.
7825343 Systems and methods for providing information to a customerMay 08, 08Nov 02, 10Invatron Systems Corp.
7793356 Signal coupling system for scanning microwave microscopeSep 11, 08Sep 07, 10KEYSIGHT TECHNOLOGIES, INC.