2024/0347,552 | METHOD FOR MANUFACTURING DRIVE CIRCUIT, DRIVE CIRCUIT AND PHOTOMASK | Dec 30, 21 | Oct 17, 24 | HKC Corporation Limited |
2024/0264,521 | METHOD FOR INVERSE OPTICAL PROXIMITY CORRECTION OF SUPER-RESOLUTION LITHOGRAPHY BASED ON LEVEL SET ALGORITHM | Dec 28, 21 | Aug 08, 24 | Not available |
2023/0138,079 | LITHOGRAPHY SYSTEM | Jun 30, 22 | May 04, 23 | Not available |
2022/0397,820 | PHOTOMASK, METHOD OF MANUFACTURING ARRAY SUBSTRATE, AND DISPLAY PANEL | Dec 31, 20 | Dec 15, 22 | TCL CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD. |
2022/0260,901 | METHOD OF LITHOGRAPHY PROCESS USING RETICLE CONTAINER WITH DISCHARGING DEVICE | Apr 29, 22 | Aug 18, 22 | Taiwan Semiconductor Manufacturing Company Ltd. |
2022/0146,924 | REFLECTIVE MASK AND FABRICATING METHOD THEREOF | Jan 19, 22 | May 12, 22 | Taiwan Semiconductor Manufacturing Co., Ltd. |
2021/0373,434 | TRANSPORT COMPLEX AND TRANSPORT MODULE INCLUDING THE SAME | Mar 01, 21 | Dec 02, 21 | Not available |
2021/0026,236 | RETICLE WITH CONDUCTIVE MATERIAL STRUCTURE | Oct 08, 20 | Jan 28, 21 | Taiwan Semiconductor Manufacturing Company Ltd. |
2020/0371,426 | ANTI-STATIC PHOTOMASK | May 22, 19 | Nov 26, 20 | Not available |
2020/0233,298 | PHOTOMASK WITH ELECTROSTATIC DISCHARGE PROTECTION | Mar 04, 19 | Jul 23, 20 | Not available |
2020/0192,213 | SUBSTRATE WITH AN ELECTRICALLY CONDUCTIVE FILM, SUBSTRATE WITH A MULTILAYER REFLECTIVE FILM, REFLECTIVE MASK BLANK, REFLECTIVE MASK AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | Feb 20, 20 | Jun 18, 20 | 501 Hoya Corporation |
2019/0094,681 | PHOTOETCHING MASK PLATE, MANUFACTURE METHOD THEREOF, AND PHOTOETCHING METHOD | Jan 11, 17 | Mar 28, 19 | BOE Technology Group Co. Ltd.; BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.; |
2019/0056,653 | REFLECTIVE MASK BLANK AND REFLECTIVE MASK | Aug 07, 18 | Feb 21, 19 | AGC INC. |
2018/0335,693 | MASK BLANK HAVING RESIST LAYER, METHOD FOR MANUFACTURING MASK BLANK HAVING RESIST LAYER, AND METHOD FOR MANUFACTURING TRANSFER MASK | Nov 07, 16 | Nov 22, 18 | 501 Hoya Corporation |
2018/0164,676 | ANTI-ESD PHOTOMASK AND METHOD OF FORMING THE SAME | Jan 30, 17 | Jun 14, 18 | Not available |
2018/0149,962 | SUBSTRATE WITH ELECTRICALLY CONDUCTIVE FILM, SUBSTRATE WITH MULTILAYER REFLECTIVE FILM, REFLECTIVE MASK BLANK, REFLECTIVE MASK, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | Jun 08, 16 | May 31, 18 | 501 Hoya Corporation |
2014/0106,266 | MASK BLANK AND PHOTOMASK | Oct 15, 13 | Apr 17, 14 | CLEAN SURFACE TECHNOLOGY CO. |
2012/0070,768 | RETICLES WITH SUBDIVIDED BLOCKING REGIONS AND METHODS OF FABRICATION | Nov 29, 11 | Mar 22, 12 | MICRON TECHNOLOGY, INC. |